FABRIS, ELENA

FABRIS, ELENA  

Università di Padova  

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Risultati 1 - 7 di 7 (tempo di esecuzione: 0.011 secondi).
Titolo Data di pubblicazione Autori Rivista Serie Titolo libro
Breakdown Walkout in Polarization-Doped Vertical GaN Diodes 2019 Fabris E.Meneghesso G.Zanoni E.Meneghini M.De Santi C.Caria A. + IEEE TRANSACTIONS ON ELECTRON DEVICES - -
Degradation Mechanisms of GaN-Based Vertical Devices: A Review 2020 Meneghini M.Fabris E.Ruzzarin M.De Santi C.Meneghesso G.Zanoni E. + PHYSICA STATUS SOLIDI. A, APPLICATIONS AND MATERIALS SCIENCE - -
Degradation of GaN-on-GaN vertical diodes submitted to high current stress 2018 Fabris, E.Meneghini, M.De Santi, C.Hu, Z.Meneghesso, G.Zanoni, E. + MICROELECTRONICS RELIABILITY - -
GaN Vertical p-i-n Diodes in Avalanche Regime: Time-Dependent Behavior and Degradation 2020 De Santi C.Fabris E.Meneghesso G.Zanoni E.Meneghini M. IEEE ELECTRON DEVICE LETTERS - -
Hot-Electron Trapping and Hole-Induced Detrapping in GaN-Based GITs and HD-GITs 2019 FABRIS, ELENAMeneghini, MatteoDe Santi, CarloBorga, MatteoMeneghesso, GaudenzioZanoni, Enrico + IEEE TRANSACTIONS ON ELECTRON DEVICES - -
Impact of Residual Carbon on Avalanche Voltage and Stability of Polarization-Induced Vertical GaN p-n Junction 2020 Fabris, ElenaDe Santi, CarloCaria, AlessandroMukherjee, KalparupaMeneghesso, GaudenzioZanoni, EnricoMeneghini, Matteo + IEEE TRANSACTIONS ON ELECTRON DEVICES - -
Trapping and Detrapping Mechanisms in β-GaO Vertical FinFETs Investigated by Electro-Optical Measurements 2020 Fabris E.De Santi C.Caria A.Meneghesso G.Zanoni E.Meneghini M. + IEEE TRANSACTIONS ON ELECTRON DEVICES - -