GILIBERTO, VALENTINA

GILIBERTO, VALENTINA  

Dipartimento di Ingegneria dell'Informazione - DEI  

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Titolo Data di pubblicazione Autori Rivista Serie Titolo libro
Accelerated testing of RF-MEMS contact degradation through radiation sources 2010 TAZZOLI, AUGUSTOBARBATO, MARCOGILIBERTO, VALENTINAGERARDIN, SIMONENICOLOSI, PIERGIORGIOPACCAGNELLA, ALESSANDROMENEGHESSO, GAUDENZIO + - - IRPS2010, International Reliability Physics Symposium
Investigation methods and approaches for alleviating charge trapping phenomena in ohmic RF-MEMS switches submitted to cycling test 2011 BARBATO, MARCOGILIBERTO, VALENTINAMENEGHESSO, GAUDENZIO + MICROELECTRONICS RELIABILITY - -
Charge trap investigation methodology on RF-MEMS switches 2011 BARBATO, MARCOGILIBERTO, VALENTINAZANONI, ENRICOMENEGHESSO, GAUDENZIO + - - MEMSWAVE 2011, 12th International Symposium on RF MEMS and RF Microsystems
Reliability of RF-MEMS switches for efficient Satellite telecommunications 2011 MENEGHESSO, GAUDENZIOBARBATO, MARCOGILIBERTO, VALENTINAZANONI, ENRICO + - - NanotechItaly 2011 - International Conference
Reliability improvement in microstructures by reducing the impact velocity through electrostatic force modulation 2012 BARBATO, MARCOGILIBERTO, VALENTINAMENEGHESSO, GAUDENZIO + MICROELECTRONICS RELIABILITY - -
A Distributed Electrical Network to Model the Local Shunting in Multicrystalline Silicon Solar Cells 2012 MAGNONE, PAOLOBARBATO, MARCOMENEGHINI, MATTEOGILIBERTO, VALENTINAMENEGHESSO, GAUDENZIO + - - 27th European Photovoltaic Solar Energy Conference and Exhibition, EU PVSEC 2012
Effect of Shunt Resistance on the Performance of mc-Silicon Solar Cells: A Combined Electro-Optical and Thermal Investigation 2012 BARBATO, MARCOMENEGHINI, MATTEOGILIBERTO, VALENTINAMAGNONE, PAOLOMENEGHESSO, GAUDENZIO + - - 38th IEEE Photovoltaic Specialists Conference, PVSC 2012
Thermal and electrical investigation of the reverse bias degradation of silicon solar cells 2013 COMPAGNIN, ALESSANDROMENEGHINI, MATTEOBARBATO, MARCOGILIBERTO, VALENTINACESTER, ANDREAZANONI, ENRICOMENEGHESSO, GAUDENZIO + MICROELECTRONICS RELIABILITY - -
Thermal And Electrical Characterization Of Catastrophic Degradation Of Silicon Solar Cells Submitted To Reverse Current Stress 2013 COMPAGNIN, ALESSANDROMENEGHINI, MATTEOGILIBERTO, VALENTINABARBATO, MARCOMARSILI, MARGHERITAZANONI, ENRICOMENEGHESSO, GAUDENZIO - - IEEE 39th Photovoltaic Specialists Conference (PVSC 2013)
A new measurement set-up to investigate the charge trapping phenomena in RF MEMS packaged switches 2013 BARBATO, MARCOGILIBERTO, VALENTINAMENEGHESSO, GAUDENZIO - - 2013 International Conference on Microelectronic Test Structures, ICMTS 2013
A Combined Mechanical and Electrical Characterization Procedure for Investigating the Dynamic Behavior of RF-MEMS Switches 2014 BARBATO, MARCOGILIBERTO, VALENTINACESTER, ANDREAMENEGHESSO, GAUDENZIO IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY - -