RONCHI, NICOLO'
 Distribuzione geografica
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Continente #
NA - Nord America 1.446
EU - Europa 168
AS - Asia 147
SA - Sud America 1
Totale 1.762
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Nazione #
US - Stati Uniti d'America 1.443
CN - Cina 106
DE - Germania 41
FI - Finlandia 38
UA - Ucraina 28
SE - Svezia 15
VN - Vietnam 15
IN - India 11
IT - Italia 11
GB - Regno Unito 8
IE - Irlanda 7
NL - Olanda 7
TW - Taiwan 7
RU - Federazione Russa 6
AT - Austria 3
CA - Canada 3
FR - Francia 3
HK - Hong Kong 3
JP - Giappone 2
KR - Corea 2
BR - Brasile 1
CH - Svizzera 1
TR - Turchia 1
Totale 1.762
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Città #
Woodbridge 224
Fairfield 187
Jacksonville 173
Houston 146
Chandler 95
Ashburn 89
Wilmington 81
Ann Arbor 80
Seattle 75
Cambridge 54
Beijing 42
Princeton 31
Medford 23
Nanjing 22
Boardman 15
Dong Ket 15
San Diego 13
Des Moines 12
Helsinki 12
Roxbury 10
Shenyang 10
Norwalk 8
Dublin 7
Cagliari 6
Hebei 5
Hsinchu 5
Munich 5
Nanchang 5
New York 5
Jiaxing 4
Roermond 4
Washington 4
Bovolenta 3
Changsha 3
Saarbrücken 3
Tianjin 3
Haikou 2
Jinan 2
Kaohsiung City 2
Laudenbach 2
London 2
Ludwigsfelde 2
Osan 2
Tappahannock 2
Vienna 2
Zhengzhou 2
Bordeaux 1
Borås 1
Dallas 1
Denver 1
Edinburgh 1
Falls Church 1
Ferrara 1
Fuzhou 1
Guangzhou 1
Kharkiv 1
Kilburn 1
Kobe 1
Kumar 1
Las Vegas 1
Lausanne 1
Ningbo 1
Ogden 1
Padova 1
Pune 1
San Francisco 1
Santa Clara 1
Shinkocho 1
São Paulo 1
Toronto 1
Yenibosna 1
Totale 1.524
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Nome #
Extensive analysis of the luminescence properties of AlGaN/GaN high electron mobility transistors 131
Reliability aspects of GaN-HEMTs on composite substrates 129
Reliability issues of Gallium Nitride High Electron Mobility Transistors 127
Reliability analysis of AlGaN/GaN HEMT on SopSiC composite substrate under long-term DC-life test 119
Correlation between DC and rf degradation due to deep levels in AlGaN/GaN HEMTs 101
Electroluminescence analysis of time-dependent reverse-bias degradation of HEMTs: a complete model 92
Impact of Hot Electrons on the Reliability of AlGaN/GaN High Electron Mobility Transistors 88
Impact of Hot Electrons on the Reliability of AlGaN/GaN High Electron Mobility Transistors 79
Electric-field and Thermally-activated Failure Mechanisms of AlGaN/GaN High Electron Mobility Transistors 75
A study of trapping phenomena on Recessed-Gate AlGaN/GaN-on- Silicon HEMT 70
Investigation of Trapping and Hot-Electron Effects in GaN HEMTs by Means of a Combined Electrooptical Method 70
An investigation of reliability on hybrid substrates GaN-HEMTs 62
GaN Hemt Degradation induced by Reverse Gate Bias Stress 57
Analysis of DC and rf degradation of AlGaN/GaN High Electron Mobility Transistors based on pulsed measurements and spectroscopic techniques 53
High Robustness GaN HEMT Subject to Reverse Bias Stress 52
Trap analysis on GaN HEMT after DC accelerated tests 52
Combined electro-optical analysis of trapping effects in AlGaN/GaN HEMTs 47
Trap related instabilities and localized damages induced by reverse bias” 46
Breakdown Walkout induced by reverse bias stress in AlGaN/GaN HEMTs 44
New reliability understanding on GaN-HEMTs 43
Reverse gate bias stress induced degradation of GaN HEMT 39
Trapping and high-field characterization in Recessed-Gate AlGaN/GaN-on-Silicon HEMT 38
An investigation of defects and reliability issues on Gallium Nitride devices 35
Kink and Cathodoluminescence in AlGaN/GaN HEMTs 34
Long-term stability of Gallium Nitride High Electron Mobility Transistors: a reliability physics approach 33
Electrical and reliability investigation of AlGaN/GaN HEMTs grown on 8° off-axis 4H-SiC 29
Latest reliability results in GaN HEMTs devices 19
Totale 1.764
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Categoria #
all - tutte 5.393
article - articoli 1.161
book - libri 0
conference - conferenze 0
curatela - curatele 0
other - altro 0
patent - brevetti 0
selected - selezionate 0
volume - volumi 0
Totale 6.554
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Totale Lug Ago Sett Ott Nov Dic Gen Feb Mar Apr Mag Giu
2018/201975 0 0 0 0 0 0 0 0 0 0 38 37
2019/2020452 64 10 0 69 37 34 29 43 45 52 43 26
2020/2021240 8 23 4 20 16 23 9 24 35 22 30 26
2021/2022225 10 52 24 7 3 10 11 14 7 6 38 43
2022/2023260 45 3 1 34 51 46 0 20 44 0 7 9
2023/202484 14 14 10 4 7 17 3 13 2 0 0 0
Totale 1.764