Sfoglia per Autore  

Opzioni
Mostrati risultati da 61 a 80 di 209
Titolo Data di pubblicazione Autori Rivista Serie Titolo libro
Space and terrestrial radiation effects in flash memories 2017 BAGATIN, MARTAGERARDIN, SIMONEPACCAGNELLA, ALESSANDRO SEMICONDUCTOR SCIENCE AND TECHNOLOGY - -
A comprehensive reliability evaluation of high-performance AlGaN/GaN HEMTs for space applications 2016 DE SANTI, CARLODALCANALE, STEFANOSTOCCO, ANTONIORAMPAZZO, FABIANAGERARDIN, SIMONEMENEGHINI, MATTEOMENEGHESSO, GAUDENZIOZANONI, ENRICO + - - proc. of the 8th Wide Bandgap Semiconductors and Components Workshop
Radiation tolerance study of a commercial 65nm CMOS technology for high energy physics applications 2016 DING, LILIGERARDIN, SIMONEBAGATIN, MARTABISELLO, DARIOMATTIAZZO, SERENAPACCAGNELLA, ALESSANDRO NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH. SECTION A, ACCELERATORS, SPECTROMETERS, DETECTORS AND ASSOCIATED EQUIPMENT - -
Design of analog front-ends for the RD53 demonstrator chip 2016 Wang A.Corsi F.Bagatin M.Bisello D.Mattiazzo S.Gerardin S.Giubilato P.Neviani A.Paccagnella A.Vogrig D.Wyss J.Minuti M.Palla F.Fanucci L.Marconi S.Passeri D.Valerio P. + POS PROCEEDINGS OF SCIENCE - Proceedings of Science
Impact of bias conditions on electrical stress and ionizing radiation effects in Si-based TFETs 2016 DING, LILIGERARDIN, SIMONEBAGATIN, MARTAPACCAGNELLA, ALESSANDRO + SOLID-STATE ELECTRONICS - -
Recent progress of RD53 Collaboration towards next generation Pixel Read-Out Chip for HL-LHC 2016 BAGATIN, MARTABISELLO, DARIOMATTIAZZO, SERENADING, LILIGERARDIN, SIMONEGIUBILATO, PIERONEVIANI, ANDREAPACCAGNELLA, ALESSANDROVOGRIG, DANIELEWYSS, JEFFERY + JOURNAL OF INSTRUMENTATION - -
Comparison of radiation degradation induced by x-ray and 3-MeV protons in 65-nm CMOS transistors 2016 DING, LILIGERARDIN, SIMONEBAGATIN, MARTABISELLO, DARIOMATTIAZZO, SERENAPACCAGNELLA, ALESSANDRO CHINESE PHYSICS B - -
Single Event Transients and Pulse Quenching Effects in Bandgap Reference Topologies for Space Applications 2016 GERARDIN, SIMONEBAGATIN, MARTAPACCAGNELLA, ALESSANDRO + IEEE TRANSACTIONS ON NUCLEAR SCIENCE - -
Muon-induced soft errors in 16-nm NAND flash memories 2016 BAGATIN, MARTAGERARDIN, SIMONEPACCAGNELLA, ALESSANDRO + - - IEEE International Reliability Physics Symposium Proceedings
Proton irradiation effects on commercial laser diodes 2015 BAGATIN, MARTAGERARDIN, SIMONEPACCAGNELLA, ALESSANDRO + - - Proceedings of the European Conference on Radiation and its Effects on Components and Systems, RADECS
Enhancement of Transistor-to-Transistor Variability Due to Total Dose Effects in 65-nm MOSFETs 2015 GERARDIN, SIMONEBAGATIN, MARTADING, LILIMATTIAZZO, SERENAPACCAGNELLA, ALESSANDRO + IEEE TRANSACTIONS ON NUCLEAR SCIENCE - -
Effects of electrical stress and ionizing radiation on Si-based TFETs 2015 GERARDIN, SIMONEPACCAGNELLA, ALESSANDROBAGATIN, MARTA + - - EUROSOI-ULIS 2015: 2015 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon
Drain Current Collapse in 65 nm pMOS Transistors After Exposure to Grad Dose 2015 DING, LILIGERARDIN, SIMONEBAGATIN, MARTAMATTIAZZO, SERENABISELLO, DARIOPACCAGNELLA, ALESSANDRO IEEE TRANSACTIONS ON NUCLEAR SCIENCE - -
Radiation-Induced Short Channel (RISCE) and Narrow Channel (RINCE) Effects in 65 and 130 nm MOSFETs 2015 PACCAGNELLA, ALESSANDROGERARDIN, SIMONE + IEEE TRANSACTIONS ON NUCLEAR SCIENCE - -
Radiation vulnerability in 65 nm CMOS I/O transistors after exposure to grad dose 2015 DING, LILIGERARDIN, SIMONEBAGATIN, MARTAMATTIAZZO, SERENABISELLO, DARIOPACCAGNELLA, ALESSANDRO - - Proceedings of the European Conference on Radiation and its Effects on Components and Systems, RADECS
Sample-to-Sample Variability of Floating Gate Errors Due to Total Ionizing Dose 2015 GERARDIN, SIMONEBAGATIN, MARTABERTOLDO, ALESSANDRAPACCAGNELLA, ALESSANDRO + IEEE TRANSACTIONS ON NUCLEAR SCIENCE - -
SEE tests of the NAND flash radiation tolerant intelligent memory stack 2015 BAGATIN, MARTAGERARDIN, SIMONEPACCAGNELLA, ALESSANDRO + - - IEEE Radiation Effects Data Workshop
CHIPIX65: Developments on a new generation pixel readout ASIC in CMOS 65 nm for HEP experiments 2015 BAGATIN, MARTABISELLO, DARIOGERARDIN, SIMONEMATTIAZZO, SERENADING, LILIGIUBILATO, PIEROPACCAGNELLA, ALESSANDRO + - - Proceedings - 2015 6th IEEE International Workshop on Advances in Sensors and Interfaces, IWASI 2015
Investigation of total ionizing dose effect and displacement damage in 65nm CMOS transistors exposed to 3MeV protons 2015 DING, LILIGERARDIN, SIMONEBAGATIN, MARTABISELLO, DARIOMATTIAZZO, SERENAPACCAGNELLA, ALESSANDRO NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH. SECTION A, ACCELERATORS, SPECTROMETERS, DETECTORS AND ASSOCIATED EQUIPMENT - -
Sensitive Volume and Extreme Shifts in Floating Gate Cells Irradiated with Heavy Ions 2015 BAGATIN, MARTAGERARDIN, SIMONEPACCAGNELLA, ALESSANDRO + IEEE TRANSACTIONS ON NUCLEAR SCIENCE - -
Mostrati risultati da 61 a 80 di 209
Legenda icone

  •  file ad accesso aperto
  •  file disponibili sulla rete interna
  •  file disponibili agli utenti autorizzati
  •  file disponibili solo agli amministratori
  •  file sotto embargo
  •  nessun file disponibile