CASU, CLAUDIA
CASU, CLAUDIA
Dipartimento di Ingegneria dell'Informazione - DEI
Bias-dependent degradation of single quantum well on InGaN-based light emitting diode
2023 Casu, C.; Buffolo, M.; Caria, A.; Piva, F.; De Santi, C.; Meneghesso, G.; Zanoni, E.; Meneghini, M.
Defects and Reliability of GaN-Based LEDs: Review and Perspectives
2022 Buffolo, M.; Caria, A.; Piva, F.; Roccato, N.; Casu, C.; De Santi, C.; Trivellin, N.; Meneghesso, G.; Zanoni, E.; Meneghini, M.
Defects in III-N LEDs: experimental identification and impact on electro-optical characteristics
2022 Buffolo, M; Roccato, N; Piva, F; De Santi, C; Brescancin, R; Casu, C; Caria, A; Mukherjee, K; Haller, C; Carlin, Jf; Grandjean, N; Vallone, M; Tibaldi, A; Bertazzi, F; Goano, M; Verzellesi, G; Mosca, M; Meneghesso, G; Zanoni, E; Meneghini, M
Effect of indium content and carrier distribution on the efficiency and reliability of InGaN/GaN-based multi quantum well light emitting diode
2021 Casu, C.; Buffolo, M.; Caria, A.; De Santi, C.; Zanoni, E.; Meneghesso, G.; Meneghini, M.
Effects of the generation and relocation of defects during the aging process of InGaN-based multi quantum well light emitting diodes
2022 Casu, C.; Buffolo, M.; Caria, A.; De Santi, C.; Zanoni, E.; Meneghesso, G.; Meneghini, M.
III-N optical devices: physical processes limiting efficiency and reliability
2022 Meneghini, M.; De Santi, C.; Buffolo, M.; Caria, A.; Piva, F.; Casu, C.; Roccato, N.; Carlin, J. F.; Grandjean, N.; Tibaldi, A.; Bertazzi, F.; Goano, M.; Verzellesi, G.; Trivellin, N.; Meneghesso, G.; Zanoni, E.
III-N optoelectronics: defects, reliability and challenges
2022 Meneghini, M.; De Santi, C.; Buffolo, M.; Caria, A.; Piva, F.; Casu, C.; Roccato, N.; Carlin, J. F.; Grandjean, N.; Tibaldi, A.; Bertazzi, F.; Goano, M.; Verzellesi, G.; Trivellin, N.; Meneghesso, G.; Zanoni, E.
Impact of Generation and Relocation of Defects on Optical Degradation of Multi-Quantum-Well InGaN/GaN-Based Light-Emitting Diode
2022 Casu, Claudia; Buffolo, Matteo; Caria, Alessandro; De Santi, Carlo; Zanoni, Enrico; Meneghesso, Gaudenzio; Meneghini, Matteo
Injection-limited efficiency of InGaN LEDs and impact on electro-optical performance and ageing: a case study
2023 Casu, Claudia; Buffolo, Matteo; Caria, Alessandro; De Santi, Carlo; Zanoni, Enrico; Meneghesso, Gaudenzio; Meneghini, Matteo
Investigation on the optical stability during ageing of InGaN-based light emitting diode
2022 Casu, C.; Buffolo, M.; Caria, A.; De Santi, C.; Meneghesso, G.; Zanoni, E.; Meneghini, M.
Modeling the effect of spatial position and concentration of defects on optical degradation of InGaN/GaN multi quantum well light emitting diodes
2022 Casu, C; Buffolo, M; Caria, A; De Santi, C; Zanoni, E; Meneghesso, G; Meneghini, M
Probing carrier transport and recombination processes in dichromatic GaN-based LEDs: a nonequilibrium Green’s function study
2022 Gonzalez Montoya, J. A.; Tibaldi, A.; Casu, C.; Roccato, N.; De Santi, C.; Meneghini, M.; Goano, M.; Bertazzi, F.
Study of the efficiency and reliability of GaN-based visible light emitting diode
2024 Casu, Claudia