CASU, CLAUDIA

CASU, CLAUDIA  

Dipartimento di Ingegneria dell'Informazione - DEI  

Mostra records
Risultati 1 - 13 di 13 (tempo di esecuzione: 0.017 secondi).
Titolo Data di pubblicazione Autori Rivista Serie Titolo libro
Bias-dependent degradation of single quantum well on InGaN-based light emitting diode 2023 Casu, C.Buffolo, M.Caria, A.Piva, F.De Santi, C.Meneghesso, G.Zanoni, E.Meneghini, M. MICROELECTRONICS RELIABILITY - -
Defects and Reliability of GaN-Based LEDs: Review and Perspectives 2022 Buffolo M.Caria A.Piva F.Roccato N.Casu C.De Santi C.Trivellin N.Meneghesso G.Zanoni E.Meneghini M. PHYSICA STATUS SOLIDI. A, APPLICATIONS AND MATERIALS SCIENCE - -
Defects in III-N LEDs: experimental identification and impact on electro-optical characteristics 2022 Buffolo, MRoccato, NPiva, FDe Santi, CCasu, CCaria, AMukherjee, KMeneghesso, GZanoni, EMeneghini, M + - PROCEEDINGS OF SPIE, THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING Proceedings Volume 12022, Light-Emitting Devices, Materials, and Applications XXVI
Effect of indium content and carrier distribution on the efficiency and reliability of InGaN/GaN-based multi quantum well light emitting diode 2021 Casu C.Buffolo M.Caria A.De Santi C.Zanoni E.Meneghesso G.Meneghini M. MICROELECTRONICS RELIABILITY - -
Effects of the generation and relocation of defects during the aging process of InGaN-based multi quantum well light emitting diodes 2022 C. CasuM. BuffoloA. CariaC. De SantiE. ZanoniG. MeneghessoM. Meneghini - - Proceedings of the 2022 International Workshop on Nitride Semiconductors
III-N optical devices: physical processes limiting efficiency and reliability 2022 M. MeneghiniC. De SantiM. BuffoloA. CariaF. PivaC. CasuN. RoccatoN. TrivellinG. MeneghessoE. Zanoni + - - Proceedings of the 8th International Symposium on Advanced Science and Technology of Silicon Materials (JSPS 2022)
III-N optoelectronics: defects, reliability and challenges 2022 M. MeneghiniC. De SantiM. BuffoloA. CariaF. PivaC. CasuN. RoccatoN. TrivellinG. MeneghessoE. Zanoni + - - Proceedings of ICOOPMA-EuroDIM 2022
Impact of Generation and Relocation of Defects on Optical Degradation of Multi-Quantum-Well InGaN/GaN-Based Light-Emitting Diode 2022 Casu, ClaudiaBuffolo, MatteoCaria, AlessandroDe Santi, CarloZanoni, EnricoMeneghesso, GaudenzioMeneghini, Matteo MICROMACHINES - -
Injection-limited efficiency of InGaN LEDs and impact on electro-optical performance and ageing: a case study 2023 Casu, ClaudiaBuffolo, MatteoCaria, AlessandroDe Santi, CarloZanoni, EnricoMeneghesso, GaudenzioMeneghini, Matteo - - Proceedings of SPIE Photonics West 2023 conference - Light-Emitting Devices, Materials, and Applications XXVII
Investigation on the optical stability during ageing of InGaN-based light emitting diode 2022 C. CasuM. BuffoloA. CariaC. De SantiG. MeneghessoE. ZanoniM. Meneghini - - Proceedings of E-MRS fall 2022
Modeling the effect of spatial position and concentration of defects on optical degradation of InGaN/GaN multi quantum well light emitting diodes 2022 Casu, CBuffolo, MCaria, ADe Santi, CZanoni, EMeneghesso, GMeneghini, M - PROCEEDINGS OF SPIE, THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING Proceedings Volume 12022, Light-Emitting Devices, Materials, and Applications XXVI
Probing carrier transport and recombination processes in dichromatic GaN-based LEDs: a nonequilibrium Green’s function study 2022 C. CasuN. RoccatoC. De SantiM. Meneghini + - - Proceedings of the 2022 International Workshop on Nitride Semiconductors
Study of the efficiency and reliability of GaN-based visible light emitting diode 2024 CASU, CLAUDIA - - -