DE SANTI, CARLO

DE SANTI, CARLO  

Dipartimento di Ingegneria dell'Informazione - DEI  

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Risultati 1 - 7 di 7 (tempo di esecuzione: 0.01 secondi).
Titolo Data di pubblicazione Autori Rivista Serie Titolo libro
Physical Modelling of Charge Trapping Effects 2024 Buffolo, MatteoDe Santi, CarloMeneghesso, GaudenzioMeneghini, MatteoZanoni, EnricoChini, Alessandro + - - Modeling of AlGaN/GaN High Electron Mobility Transistors
GaN-Based Lateral and Vertical Devices 2023 Meneghini M.De Santi C.Zanoni E.Meneghesso G. + - - Springer Handbook of Semiconductor Devices
Degradation mechanisms of InGaN visible LEDs and AlGaN UV LEDs 2021 De Santi C.Caria A.Piva F.Meneghesso G.Zanoni E.Meneghini M. - - Reliability of Semiconductor Lasers and Optoelectronic Devices
Reliability of Ultraviolet Light-Emitting Diodes 2019 C. De SantiD. MontiDalapati, PradipM. MeneghiniG. MeneghessoE. Zanoni - - Solid State Lighting Technology and Application Series
Physical mechanisms limiting the performance and the reliability of GaN-based LEDs 2018 C. De SantiM. MeneghiniG. MeneghessoE. Zanoni + - - Nitride Semiconductor Light-Emitting Diodes (LEDs): Materials, Technologies, and Applications
Chip-Level Degradation of InGaN-Based Optoelectronic Devices 2017 C. De SantiM. MeneghiniG. MeneghessoE. Zanoni - - Solid State Lighting Reliability Part 2: Components to Systems
Performance-Limiting Traps in GaN-Based HEMTs: From Native Defects to Common Impurities 2016 I. RossettoD. BisiC. De SantiA. StoccoG. MeneghessoE. ZanoniM. Meneghini - - Power GaN Devices: Materials, Applications and Reliability