TRIVELLIN, NICOLA

TRIVELLIN, NICOLA  

Dipartimento di Ingegneria Industriale - DII  

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Risultati 1 - 20 di 59 (tempo di esecuzione: 0.03 secondi).
Titolo Data di pubblicazione Autori Rivista Serie Titolo libro
"Hot-plugging" of LED modules: Electrical characterization and device degradation 2013 DAL LAGO, MATTEOMENEGHINI, MATTEOTRIVELLIN, NICOLAMENEGHESSO, GAUDENZIOZANONI, ENRICO + MICROELECTRONICS RELIABILITY - -
A combined electro-optical method for the determination of the recombination parameters in InGaN-based light-emitting diodes 2009 MENEGHINI, MATTEOTRIVELLIN, NICOLAMENEGHESSO, GAUDENZIOZANONI, ENRICO + JOURNAL OF APPLIED PHYSICS - -
A multiwavelength model to improve microalgal productivity and energetic conversion in a red-blue light emitting diodes (LEDs) continuous photobioreactor 2021 Borella, LisaOrtolan, DavideBarbera, ElenaTrivellin, NicolaSforza, Eleonora ENERGY CONVERSION AND MANAGEMENT - -
Analysis of Defect-Related Localized Emission Processes in InGaN/GaN-Based LEDs 2012 MENEGHINI, MATTEOVACCARI, SIMONETRIVELLIN, NICOLAMENEGHESSO, GAUDENZIOZANONI, ENRICO + IEEE TRANSACTIONS ON ELECTRON DEVICES - -
Analysis of Diffusion-Related Gradual Degradation of InGaN-Based Laser Diodes 2012 MENEGHINI, MATTEOTRIVELLIN, NICOLAZANONI, ENRICOMENEGHESSO, GAUDENZIO + IEEE JOURNAL OF QUANTUM ELECTRONICS - -
Analysis of the role of current in the degradation of InGaN-based laser diodes 2009 MENEGHINI, MATTEOTRIVELLIN, NICOLAMENEGHESSO, GAUDENZIOTREVISANELLO, LORENZO ROBERTOZANONI, ENRICO + PHYSICA STATUS SOLIDI. C, CURRENT TOPICS IN SOLID STATE PHYSICS - -
Analysis of the Role of Current, Temperature, and Optical Power in the Degradation of InGaN-Based Laser Diodes 2009 MENEGHINI, MATTEOTRIVELLIN, NICOLAZANONI, ENRICOMENEGHESSO, GAUDENZIO + IEEE TRANSACTIONS ON ELECTRON DEVICES - -
Application of flashing blue-red LED to boost microalgae biomass productivity and energy efficiency in continuous photobioreactors 2022 Borella L.Diotto D.Barbera E.Fiorimonte D.Sforza E.Trivellin N. ENERGY - -
Atmospheres in a Test Tube: state of the art at the Astronomical Observatory of Padova. 2016 CLAUDI, RICCARDOCOCOLA, LORENZOLA ROCCA, NICOLETTAMOROSINOTTO, TOMASPOLETTO, LUCAGALLETTA, GIUSEPPETRIVELLIN, NICOLA + MEMORIE DELLA SOCIETÀ ASTRONOMICA ITALIANA - -
Autonomous IoT Monitoring Matching Spectral Artificial Light Manipulation for Horticulture 2022 Pozzebon A.Trivellin N. + SENSORS - -
Benefits and Risks of the Technological Creep of LED Light Technologies Applied to the Purse Seine Fishery 2022 Trivellin N. + BIOLOGY - -
CdTe solar cells: Technology, operation and reliability 2021 Barbato M.Bertoncello M.Meneghini M.Trivellin N.Mantoan E.Zanoni E.Meneghesso G. + JOURNAL OF PHYSICS D. APPLIED PHYSICS - -
Chip and package-related degradation of high power white LEDs 2012 MENEGHINI, MATTEODAL LAGO, MATTEOTRIVELLIN, NICOLAMENEGHESSO, GAUDENZIOZANONI, ENRICO + MICROELECTRONICS RELIABILITY - -
Current induced degradation study on state of the art DUV LEDs 2018 Trivellin, N.Monti, D.De Santi, C.Buffolo, M.Meneghesso, G.Zanoni, E.Meneghini, M. MICROELECTRONICS RELIABILITY - -
Defects and Reliability of GaN-Based LEDs: Review and Perspectives 2022 Buffolo M.Caria A.Piva F.Roccato N.Casu C.De Santi C.Trivellin N.Meneghesso G.Zanoni E.Meneghini M. PHYSICA STATUS SOLIDI. A, APPLICATIONS AND MATERIALS SCIENCE - -
Degradation Mechanisms of High Power LEDs for Lighting Applications: an overview 2014 MENEGHINI, MATTEODAL LAGO, MATTEOTRIVELLIN, NICOLAMENEGHESSO, GAUDENZIOZANONI, ENRICO IEEE TRANSACTIONS ON INDUSTRY APPLICATIONS - -
Degradation mechanisms of high-power white LEDs activated by current and temperature 2011 DAL LAGO, MATTEOMENEGHINI, MATTEOTRIVELLIN, NICOLAMENEGHESSO, GAUDENZIOZANONI, ENRICO MICROELECTRONICS RELIABILITY - -
Degradation of InGaN lasers: Role of non-radiative recombination and injection efficiency 2011 TRIVELLIN, NICOLAMENEGHINI, MATTEODE SANTI, CARLOVACCARI, SIMONEMENEGHESSO, GAUDENZIOZANONI, ENRICO + MICROELECTRONICS RELIABILITY - -
Degradation of InGaN-based laser diodes analyzed by means of electrical and optical measurements 2010 MENEGHINI, MATTEOTRIVELLIN, NICOLAMENEGHESSO, GAUDENZIOZANONI, ENRICO + APPLIED PHYSICS LETTERS - -
Degradation of InGaN-based laser diodes due to increased non-radiative recombination rate 2010 TRIVELLIN, NICOLAMENEGHINI, MATTEOZANONI, ENRICOMENEGHESSO, GAUDENZIO + PHYSICA STATUS SOLIDI. A, APPLICATIONS AND MATERIALS SCIENCE - -