TRIVELLIN, NICOLA

TRIVELLIN, NICOLA  

Dipartimento di Ingegneria Industriale - DII  

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Risultati 1 - 20 di 149 (tempo di esecuzione: 0.036 secondi).
Titolo Data di pubblicazione Autori Rivista Serie Titolo libro
High temperature degradation of ohmic contacts on p-GaN 2007 TRIVELLIN, NICOLAMENEGHINI, MATTEOTREVISANELLO, LORENZO ROBERTOMENEGHESSO, GAUDENZIOZANONI, ENRICO + - - -
Analysis of the role of current in the degradation of InGaN-based laser diodes 2008 MENEGHINI, MATTEOTRIVELLIN, NICOLAMENEGHESSO, GAUDENZIOTREVISANELLO, LORENZO ROBERTOZANONI, ENRICO + - - -
Thermal-activated degradation mechanism on Phosphor-Converted Light Emitting Diode 2008 TREVISANELLO, LORENZO ROBERTOTRIVELLIN, NICOLAMENEGHINI, MATTEOZANONI, ENRICOMENEGHESSO, GAUDENZIO - - -
Combined Optical And Electrical Analysis of AlGaN-Based Deep-UV LEDs Reliability 2008 MENEGHINI, MATTEOTRIVELLIN, NICOLATREVISANELLO, LORENZO ROBERTOZANONI, ENRICOMENEGHESSO, GAUDENZIO + - - -
Extensive analysis of the degradation of blu-ray laser diodes 2008 MENEGHINI, MATTEOMENEGHESSO, GAUDENZIOTRIVELLIN, NICOLAZANONI, ENRICO + IEEE ELECTRON DEVICE LETTERS - -
Reliability of deep-UV light-emitting diodes 2008 MENEGHINI, MATTEOTRIVELLIN, NICOLAZANONI, ENRICOMENEGHESSO, GAUDENZIO + IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY - -
Role of non-radiative recombination in the degradation of InGaN-based laser diodes 2008 MENEGHINI, MATTEOTRIVELLIN, NICOLAZANONI, ENRICOMENEGHESSO, GAUDENZIO + - - -
Electro-thermally Activated Degradation of Blu-Ray GaN-based Laser Diodes 2008 MENEGHINI, MATTEOMENEGHESSO, GAUDENZIOTRIVELLIN, NICOLATREVISANELLO, LORENZO ROBERTOZANONI, ENRICO + - - -
Analysis of the Degradation of Blu-Ray Laser Diodes 2008 TRIVELLIN, NICOLAMENEGHINI, MATTEOMENEGHESSO, GAUDENZIOTREVISANELLO, LORENZO ROBERTOZANONI, ENRICO + - - -
Degradation of InGaN-Based Leds Induced by Reverse Bias Stress 2009 MENEGHINI, MATTEOTRIVELLIN, NICOLAMENEGHESSO, GAUDENZIOZANONI, ENRICO + - - -
Effects of Electro-Thermal stress on AlGaN deep-ultraviolet LEDs 2009 TRIVELLIN, NICOLAMENEGHINI, MATTEODAL LAGO, MATTEOMENEGHESSO, GAUDENZIOZANONI, ENRICO + - - -
Extensive analysis of the degradation of phosphor-converted LEDs 2009 MENEGHINI, MATTEOTREVISANELLO, LORENZO ROBERTOTRIVELLIN, NICOLAMENEGHESSO, GAUDENZIOZANONI, ENRICO + - - Proc. SPIE 7422, 74220H, 2009, Ninth International Conference on Solid State Lighting
Degradation of InGaN-Based Laser Diodes Related to Nonradiative Recombination 2009 MENEGHINI, MATTEOTRIVELLIN, NICOLAZANONI, ENRICOMENEGHESSO, GAUDENZIO + IEEE ELECTRON DEVICE LETTERS - -
Degradation of InGaN-based laser diodes due to increasednon-radiative recombination 2009 TRIVELLIN, NICOLAMENEGHINI, MATTEOZANONI, ENRICOMENEGHESSO, GAUDENZIO + - - -
Non-Radiative lifetime variation during the degradation of Blu-Ray InGaN Laser Diode 2009 TRIVELLIN, NICOLAMENEGHINI, MATTEOMENEGHESSO, GAUDENZIOZANONI, ENRICO + - - -
Thermally activated degradation and package instabilities of low power PC-LEDs 2009 TREVISANELLO, LORENZO ROBERTOMENEGHINI, MATTEOTRIVELLIN, NICOLAZANONI, ENRICOMENEGHESSO, GAUDENZIO - - -
INCUBATOR SYSTEM FOR EGGS AND/OR EMBRYOS OF AQUATIC ORGANISMS 2009 GUIDOLIN, LAURAIORI, GIULIOMAGARAGGIA, MICHELACAMERIN, MONICAMENEGHINI, MATTEOZANONI, ENRICOBARBATO, ALESSANDROTRIVELLIN, NICOLA - - -
A combined electro-optical method for the determination of the recombination parameters in InGaN-based light-emitting diodes 2009 MENEGHINI, MATTEOTRIVELLIN, NICOLAMENEGHESSO, GAUDENZIOZANONI, ENRICO + JOURNAL OF APPLIED PHYSICS - -
Reliability analysis of InGaN Blu-Ray laser diode 2009 TRIVELLIN, NICOLAMENEGHINI, MATTEOMENEGHESSO, GAUDENZIOZANONI, ENRICO + MICROELECTRONICS RELIABILITY - -
Reliability evaluation for Blu-Ray laser diodes 2009 MENEGHINI, MATTEOTRIVELLIN, NICOLAZANONI, ENRICOMENEGHESSO, GAUDENZIO + - - -