PIVA, FRANCESCO

PIVA, FRANCESCO  

Dipartimento di Ingegneria dell'Informazione - DEI  

Mostra records
Risultati 1 - 20 di 29 (tempo di esecuzione: 0.036 secondi).
Titolo Data di pubblicazione Autori Rivista Serie Titolo libro
Challenges for highly reliable GaN-based LEDs 2019 Zanoni E.De Santi C.Trivellin N.Renso N.Buffolo M.Monti D.Caria A.Piva F.Meneghesso G.Meneghini M. - PROCEEDINGS OF SPIE, THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING Proceedings of SPIE - The International Society for Optical Engineering
Stability and degradation of AlGaN-based UV-B LEDs: Role of doping and semiconductor defects 2019 Piva F.De Santi C.Amano H.Shibata N.Meneghesso G.Zanoni E.Meneghini M. + MICROELECTRONICS RELIABILITY - -
Degradation processes of 280 nm high power DUV LEDs: Impact on parasitic luminescence 2019 Trivellin N.Monti D.Piva F.Buffolo M.De Santi C.Zanoni E.Meneghesso G.Meneghini M. JAPANESE JOURNAL OF APPLIED PHYSICS - -
High-Current Stress of UV-B (In)AlGaN-Based LEDs: Defect-Generation and Diffusion Processes 2019 Monti D.De Santi C.DA RUOS, SARAPIVA, FRANCESCOMeneghesso G.Zanoni E.Meneghini M. + IEEE TRANSACTIONS ON ELECTRON DEVICES - -
Role of defects in the mid-term degradation of UV-B LEDs investigated by optical and DLTS measurements 2020 Piva F.De Santi C.Meneghesso G.Zanoni E.Meneghini M. + - PROCEEDINGS OF SPIE, THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING Proceedings of SPIE - The International Society for Optical Engineering
Degradation mechanisms of 1.6 W blue semiconductor lasers: Effect on subthreshold optical power and power spectral density 2020 Piva F.De Santi C.Buffolo M.Meneghesso G.Zanoni E.Meneghini M. + - PROCEEDINGS OF SPIE, THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING Proceedings of SPIE - The International Society for Optical Engineering
Degradation mechanisms in high power InGaN semiconductor lasers investigated by electrical, optical, spectral and C-DLTS measurements 2020 Piva F.De Santi C.Buffolo M.Meneghesso G.Zanoni E.Meneghini M. + MICROELECTRONICS RELIABILITY - -
Modeling the degradation mechanisms of AlGaN-based UV-C LEDs: From injection efficiency to mid-gap state generation 2020 PIVA F.DE SANTI C.AMANO H.MENEGHESSO G.ZANONI E.MENEGHINI M. + PHOTONICS RESEARCH - -
Defect incorporation in In-containing layers and quantum wells: Experimental analysis via deep level profiling and optical spectroscopy 2021 Piva F.De Santi C.Caria A.Meneghesso G.Zanoni E.Meneghini M. + JOURNAL OF PHYSICS D. APPLIED PHYSICS - -
Modeling the electrical characteristics of InGaN/GaN LED structures based on experimentally-measured defect characteristics 2021 Roccato N.Piva F.Santi C. D.Mukherjee K.Buffolo M.Verzellesi G.Meneghesso G.Zanoni E.Meneghini M. + JOURNAL OF PHYSICS D. APPLIED PHYSICS - -
Uv-based technologies for sars-cov2 inactivation: Status and perspectives 2021 Trivellin N.Piva F.Fiorimonte D.Buffolo M.De Santi C.Dughiero F.Meneghesso G.Zanoni E.Meneghini M. + ELECTRONICS - -
Effects of quantum-well indium content on deep defects and reliability of InGaN/GaN light-emitting diodes with under layer 2021 Roccato N.Piva F.De Santi C.Buffolo M.Meneghesso G.Zanoni E.Meneghini M. + JOURNAL OF PHYSICS D. APPLIED PHYSICS - -
Decrease in the injection efficiency and generation of midgap states in UV-C LEDs: A model based on rate equations 2021 Piva F.De Santi C.Buffolo M.Meneghesso G.Zanoni E.Meneghini M. + - - Proceedings of SPIE - The International Society for Optical Engineering Volume 11686
How does an In-containing underlayer prevent the propagation of defects in InGaN QW LEDs? identification of SRH centers and modeling of trap profile 2021 Piva F.De Santi C.Caria A.Buffolo M.Meneghesso G.Zanoni E.Meneghini M. + - PROCEEDINGS OF SPIE, THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING Proceedings of SPIE - The International Society for Optical Engineering
Review on the degradation of GaN-based lateral power transistors 2021 De Santi, C.Buffolo, M.Caria, A.Chiocchetta, F.Favero, D.Fregolent, M.Masin, F.Modolo, N.Nardo, A.Piva, F.Rampazzo, F.Trivellin, N.Gao, Z.Meneghini, M.Zanoni, E.Meneghesso, G. + E-PRIME, ADVANCES IN ELECTRICAL ENGINEERING, ELECTRONICS AND ENERGY - -
Degradation mechanisms of InGaN visible LEDs and AlGaN UV LEDs 2021 De Santi C.Caria A.Piva F.Meneghesso G.Zanoni E.Meneghini M. - - Reliability of Semiconductor Lasers and Optoelectronic Devices
Analysis of degradation mechanisms in UVC single QW LEDs through electrical, optical and spectral measurements 2022 F. PivaN. RoccatoM. BuffoloC. De SantiM. PilatiG. MeneghessoE. ZanoniM. Meneghini + - - Proceedings of the 2022 International Workshop on Nitride Semiconductors
III-N optoelectronics: defects, reliability and challenges 2022 M. MeneghiniC. De SantiM. BuffoloA. CariaF. PivaC. CasuN. RoccatoN. TrivellinG. MeneghessoE. Zanoni + - - Proceedings of ICOOPMA-EuroDIM 2022
Reliability of Commercial UVC LEDs: 2022 State-of-the-Art 2022 Trivellin N.Fiorimonte D.Piva F.Buffolo M.De Santi C.Meneghesso G.Zanoni E.Meneghini M. ELECTRONICS - -
Defects and Reliability of GaN-Based LEDs: Review and Perspectives 2022 Buffolo M.Caria A.Piva F.Roccato N.Casu C.De Santi C.Trivellin N.Meneghesso G.Zanoni E.Meneghini M. PHYSICA STATUS SOLIDI. A, APPLICATIONS AND MATERIALS SCIENCE - -