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Mostrati risultati da 1 a 20 di 24
Titolo Data di pubblicazione Autori Rivista Serie Titolo libro
Reliability and efficiency-limiting mechanisms in III-N LEDs: an experimental analysis assisted by numerical simulations 2024 ROCCATO, NICOLA - - -
Modeling of the electrical characteristics and degradation mechanisms of UV-C LEDs 2024 Roccato, NicolaPiva, FrancescoDe Santi, CarloBuffolo, MatteoMeneghesso, GaudenzioZanoni, EnricoMeneghini, Matteo + IEEE PHOTONICS JOURNAL - -
Lifetime limiting degradation mechanisms of state-of-the-art UVC LEDs 2023 Enrico ZanoniFrancesco PivaMatteo BuffoloNicola TrivellinCarlo De SantiNicola RoccatoMarco PilatiGaudenzio MeneghessoMatteo Meneghini + - - Proceedings of MRS fall 2023 conference
On the degradation mechanisms of state-of-the-art UV-C LEDs 2023 Matteo BuffoloFrancesco PivaNicola RoccatoCarlo De SantiNicola TrivellinMarco PilatiGaudenzio MeneghessoEnrico ZanoniMatteo Meneghini + - - Proceedings of ICNS-14
Degradation of AlGaN-based SQW UV-C LEDs investigated by capacitance deep level transient spectroscopy 2023 Piva F.Buffolo M.De Santi C.Pilati M.Roccato N.Meneghesso G.Zanoni E.Meneghini M. + - - Proceedings of SPIE Photonics West 2023 conference
Modeling the electrical degradation of AlGaN-based UV-C LEDs by combined deep-level optical spectroscopy and TCAD simulations 2023 Roccato N.Piva F.De Santi C.Buffolo M.Fregolent M.Pilati M.Meneghesso G.Zanoni E.Meneghini M. + APPLIED PHYSICS LETTERS - -
Degradation of AlGaN-based UV-C SQW LEDs analyzed by means of capacitance deep-level transient spectroscopy and numerical simulations 2023 Piva F.Pilati M.Buffolo M.Roccato N.De Santi C.Meneghesso G.Zanoni E.Meneghini M. + APPLIED PHYSICS LETTERS - -
Modeling the electrical characteristic and degradation mechanisms of UV-C LEDs 2023 Roccato, NicolaPiva, FrancescoDe Santi, CarloBuffolo, MatteoMeneghesso, GaudenzioZanoni, EnricoMeneghini, Matteo + - - Proceedings of 2023 International Conference on Numerical Simulation of Optoelectronic Devices (NUSOD)
On the importance of Fast and Accurate LED Optical and Thermal Characterization: from visible use cases to UV technologies 2023 Trivellin, NicolaRoccato, NicolaPiva, FrancescoBuffolo, MatteoDe Santi, CarloNarduzzi, ClaudioFraccaroli, RiccardoCaria, AlessandroMeneghesso, GaudenzioZanoni, EnricoMeneghini, Matteo - - Proceedings of the 29th International Workshop on Thermal Investigations of ICs and Systems (THERMINIC)
III-N optoelectronic devices: understanding the physics of electro-optical degradation 2023 Meneghini, MatteoRoccato, NicolaPiva, FrancescoDe Santi, CarloBuffolo, MatteoMeneghesso, GaudenzioZanoni, Enrico + - - Proc. SPIE 12441, Light-Emitting Devices, Materials, and Applications XXVII
III-N optoelectronics: defects, reliability and challenges 2022 M. MeneghiniC. De SantiM. BuffoloA. CariaF. PivaC. CasuN. RoccatoN. TrivellinG. MeneghessoE. Zanoni + - - Proceedings of ICOOPMA-EuroDIM 2022
Discriminating the effects of deep-levels in InGaN/GaN LEDs: impact on forward leakage current 2022 M. BuffoloN. RoccatoF. PivaC. De SantiN. GrandjeanG. MeneghessoE. ZanoniM. Meneghini + - - Proceedings of E-MRS fall 2022
DLTS-based defect analysis in UV-C single QW LEDs during a constant current stress 2022 F. PivaM. BuffoloC. De SantiN. RoccatoG. MeneghessoE. ZanoniM. Meneghini + - - Proceedings of E-MRS fall 2022
Defects in III-N LEDs: experimental identification and impact on electro-optical characteristics 2022 Buffolo, MRoccato, NPiva, FDe Santi, CCasu, CCaria, AMukherjee, KMeneghesso, GZanoni, EMeneghini, M + - PROCEEDINGS OF SPIE, THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING Proceedings Volume 12022, Light-Emitting Devices, Materials, and Applications XXVI
UV LED reliability: degradation mechanisms and challenges 2022 Meneghini, MPiva, FDe Santi, CTrivellin, NBuffolo, MRoccato, NFiorimonte, DMeneghesso, GZanoni, E + - PROCEEDINGS OF SPIE, THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING Proceedings Volume 12001, Gallium Nitride Materials and Devices XVII
Analysis of degradation mechanisms in UVC single QW LEDs through electrical, optical and spectral measurements 2022 F. PivaN. RoccatoM. BuffoloC. De SantiM. PilatiG. MeneghessoE. ZanoniM. Meneghini + - - Proceedings of the 2022 International Workshop on Nitride Semiconductors
Modeling of TAT-related forward leakage current in InGaN/GaN SQW LEDs based on experimentally-determined defects parameters 2022 M. BuffoloN. RoccatoFrancesco PivaCarlo De SantiG. VerzellesiG. MeneghessoE. ZanoniM. Meneghini + - - Proceedings of the 2022 International Workshop on Nitride Semiconductors
Probing carrier transport and recombination processes in dichromatic GaN-based LEDs: a nonequilibrium Green’s function study 2022 C. CasuN. RoccatoC. De SantiM. Meneghini + - - Proceedings of the 2022 International Workshop on Nitride Semiconductors
Defects and Reliability of GaN-Based LEDs: Review and Perspectives 2022 Buffolo M.Caria A.Piva F.Roccato N.Casu C.De Santi C.Trivellin N.Meneghesso G.Zanoni E.Meneghini M. PHYSICA STATUS SOLIDI. A, APPLICATIONS AND MATERIALS SCIENCE - -
Deep defects in InGaN LEDs: modeling the impact on the electrical characteristics 2022 Roccato, NPiva, FDe Santi, CBuffolo, MMeneghesso, GZanoni, EMeneghini, M + - PROCEEDINGS OF SPIE, THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING Proceedings Volume 12001, Gallium Nitride Materials and Devices XVII
Mostrati risultati da 1 a 20 di 24
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