Sfoglia per Autore
Understanding the Optical Degradation of 845 nm Micro-Transfer-Printed VCSILs for Photonic Integrated Circuits
2023 Zenari, M; Buffolo, M; Fornasier, M; De Santi, C; Goyvaerts, J; Grabowski, A; Gustavsson, J; Kumari, S; Stassren, A; Baets, R; Larsson, A; Roelkens, G; Meneghesso, G; Zanoni, E; Meneghini, M
Improving the Reliability of InAs Quantum-Dot Laser Diodes for Silicon Photonics: the Role of Trapping Layers and Misfit-Dislocation Density
2023 Buffolo, M.; Zenari, M.; De Santi, C.; Shang, C.; Hughes, E.; Wan, Y.; Bowers, J. E.; Herrick, R. W.; Meneghesso, G.; Zanoni, E.; Meneghini, M.
Degradation mechanisms of laser diodes for silicon photonics applications
2023 De Santi, C.; Buffolo, M.; Zenari, M.; Shang, C.; Bowers, J. E.; Meneghesso, G.; Zanoni, E.; Meneghini, M.
Performance and Degradation of Commercial Ultraviolet-C Light-Emitting Diodes for Disinfection Purposes
2023 Trivellin, N; Piva, F; Fiorimonte, D; Buffolo, M; De Santi, C; Zanoni, E; Meneghesso, G; Meneghini, M
Lifetime Prediction of Current-and Temperature-Induced Degradation in Silicone-Encapsulated 365 nm High-Power Light-Emitting Diodes
2023 Herzog, A; Benkner, S; Zandi, B; Buffolo, M; Van Driel, Wd; Meneghini, M; Khanh, Tq
Characterization and Modeling of quantum efficiency InGaN-GaN Multi-Quantum Well (MQW) solar cells
2022 Nicoletto, M.; Caria, A.; De Santi, C.; Buffolo, M.; Huang, X.; Fu, H.; Chen, H.; Zhao, Y.; Meneghesso, G.; Zanoni, E.; Meneghini, M.
Effects of the generation and relocation of defects during the aging process of InGaN-based multi quantum well light emitting diodes
2022 Casu, C.; Buffolo, M.; Caria, A.; De Santi, C.; Zanoni, E.; Meneghesso, G.; Meneghini, M.
III-N optoelectronics: defects, reliability and challenges
2022 Meneghini, M.; De Santi, C.; Buffolo, M.; Caria, A.; Piva, F.; Casu, C.; Roccato, N.; Carlin, J. F.; Grandjean, N.; Tibaldi, A.; Bertazzi, F.; Goano, M.; Verzellesi, G.; Trivellin, N.; Meneghesso, G.; Zanoni, E.
Discriminating the effects of deep-levels in InGaN/GaN LEDs: impact on forward leakage current
2022 Buffolo, M.; Roccato, N.; Piva, F.; De Santi, C.; Haller, C.; Carlin, Jean-François; Grandjean, N.; Vallone, M.; Tibaldic, A.; Bertazzi, F.; Goano, M.; Verzellesi, G.; Meneghesso, G.; Zanoni, E.; Meneghini, M.
Investigation on the optical stability during ageing of InGaN-based light emitting diode
2022 Casu, C.; Buffolo, M.; Caria, A.; De Santi, C.; Meneghesso, G.; Zanoni, E.; Meneghini, M.
Modeling of the Conduction Processes and Deep Levels in Annealed Nitrogen-Implanted β-Gallium Oxide Schottky diodes
2022 De Santi, C.; Fregolent, M.; Buffolo, M.; Higashiwaki, M.; Meneghesso, G.; Zanoni, E.; Meneghini, M.
DLTS-based defect analysis in UV-C single QW LEDs during a constant current stress
2022 Piva, F.; Buffolo, M.; De Santi, C.; Pilati, M.; Roccato, N.; Susilo, N.; Guttmann, M.; Sulmoni, L.; Wernicke, T.; Kneissl, M.; Meneghesso, G.; Zanoni, E.; Meneghini, M.
Optical temperature measurement across IR opaque layers by means of visible excitation and photoluminescence
2022 Trivellin, N; Buffolo, M; De Santi, C; Meneghini, M; Forzan, M; Dughiero, F; Zanoni, E; Meneghesso, G
Optical Degradation of InAs Quantum-Dot lasers on Silicon: Dependence on Temperature and on Diffusion Processes
2022 Buffolo, M; Zenari, M; De Santi, C; Norman, J; Bowers, Je; Herrick, Rw; Meneghesso, G; Zanoni, E; Meneghini, M
Modeling the effect of spatial position and concentration of defects on optical degradation of InGaN/GaN multi quantum well light emitting diodes
2022 Casu, C; Buffolo, M; Caria, A; De Santi, C; Zanoni, E; Meneghesso, G; Meneghini, M
Investigation of deep level defects in n-type GaAsBi
2022 Fregolent, M; Buffolo, M; De Santi, C; Hasegawa, S; Matsumura, J; Nishinaka, H; Yoshimoto, M; Meneghesso, G; Zanoni, E; Meneghini, M
Analysis of dislocation-related and point-defects in III-As layers by extensive DLTS study
2022 Zenari, M; Buffolo, M; De Santi, C; Norman, J; Meneghesso, G; Bowers, Je; Zanoni, E; Meneghini, M
Defects in III-N LEDs: experimental identification and impact on electro-optical characteristics
2022 Buffolo, M; Roccato, N; Piva, F; De Santi, C; Brescancin, R; Casu, C; Caria, A; Mukherjee, K; Haller, C; Carlin, Jf; Grandjean, N; Vallone, M; Tibaldi, A; Bertazzi, F; Goano, M; Verzellesi, G; Mosca, M; Meneghesso, G; Zanoni, E; Meneghini, M
III-N optical devices: physical processes limiting efficiency and reliability
2022 Meneghini, M.; De Santi, C.; Buffolo, M.; Caria, A.; Piva, F.; Casu, C.; Roccato, N.; Carlin, J. F.; Grandjean, N.; Tibaldi, A.; Bertazzi, F.; Goano, M.; Verzellesi, G.; Trivellin, N.; Meneghesso, G.; Zanoni, E.
Dynamic performance of wide bandgap devices
2022 De Santi, C.; Fregolent, M.; Modolo, N.; Nardo, A.; Buffolo, M.; Rampazzo, F.; Meneghesso, G.; Zanoni, E.; Meneghini, M.
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