TAZZOLI, AUGUSTO
TAZZOLI, AUGUSTO
A comprehensive study of MEMS behavior under EOS/ESD events: Breakdown characterization, dielectric charging, and realistic cures
2011 Tazzoli, Augusto; Barbato, Marco; Ritrovato, V; Meneghesso, Gaudenzio
A novel fast and versatile temperature measurement system for LDMOS transistors
2005 Tazzoli, Augusto; Meneghesso, Gaudenzio; Zanoni, Enrico
A Review on the Physical Mechanisms That Limit the Reliability of GaN-Based LEDs
2010 Meneghini, Matteo; Tazzoli, Augusto; Mura, G; Meneghesso, Gaudenzio; Zanoni, Enrico
Acceleration of Microwelding on Ohmic RF-MEMS Switches
2011 Tazzoli, Augusto; Meneghesso, Gaudenzio
An active heat-based restoring mechanism for improving the reliability of RF-MEMS switches
2011 Iannacci, J; Faes, A; Repchankova, A; Tazzoli, Augusto; Meneghesso, Gaudenzio
Breakdown characterization of gate oxides in 35 and 70 angstrom BCD8 smart power technology
2009 Tazzoli, Augusto; Cerati, L; Andreini, A; Meneghesso, Gaudenzio
Design and Characterization of an Active Recovering Mechanism for High Performance RF MEMS Redundancy Switches
2011 F., Solazzi; Tazzoli, Augusto; P., Farinelli; A., Faes; V., Mulloni; B., Margesin; Meneghesso, Gaudenzio
Electrical characterization and reliability study of HEMTs on composite substrates under high electric fields
2008 Tazzoli, Augusto; Meneghesso, Gaudenzio; Zanon, Franco; Danesin, Francesca; Zanoni, Enrico; Bove, P; Langer, R; Thorpe, J.
Electrostatic Discharge and Cycling effects on Ohmic and capacitive RF-MEMS Switches
2007 Tazzoli, Augusto; Peretti, Vanni; Meneghesso, Gaudenzio
Electrostatic Discharge Effects in Irradiated Fully Depleted SOI MOSFETs with Ultra-Thin Gate Oxide
2007 Gerardin, Simone; Griffoni, Alessio; Tazzoli, Augusto; Cester, Andrea; Meneghesso, Gaudenzio; Paccagnella, Alessandro
Electrostatic discharge effects in ultrathin gate oxide MOSFETs
2006 Cester, Andrea; Gerardin, Simone; Tazzoli, Augusto; Meneghesso, Gaudenzio
Enhancement of RF-MEMS switch reliability through an active anti-stiction heat-based mechanism
2010 Iannacci, J; Repchankova, A; Faes, A; Tazzoli, Augusto; Meneghesso, Gaudenzio; DALLA BETTA, Gf
ESD sensitivity of a GaAs MMIC microwave power amplifier
2011 Tazzoli, Augusto; Rossetto, Isabella; Zanoni, Enrico; Dai, Yf; Tomasi, T; Meneghesso, Gaudenzio
Experimental Investigation on the Exploitation of an Active Mechanism to Restore the Operability of Malfunctioning RF-MEMS Switches
2010 J., Iannacci; A., Repchankova; A., Faes; Tazzoli, Augusto; Meneghesso, Gaudenzio; M., Niessner
Holding voltage investigation of advanced SCR-based protection structures for CMOS technology
2007 Tazzoli, Augusto; Marino, FABIO ALESSIO; Cordoni, M; Benvenuti, A; Colombo, P; Zanoni, Enrico; Meneghesso, Gaudenzio
Impact of Trapped Charge and Interface Defects on the Degradation of the Optical and Electrical Characteristics in NPD/Alq3 OLEDs
2010 Pinato, Alessandro; Cester, Andrea; Meneghini, Matteo; Wrachien, Nicola; Tazzoli, Augusto; S., Xia; V., Adamovich; M. S., Weaver; J. J., Brown; Zanoni, Enrico; Meneghesso, Gaudenzio
K-band capacitive MEMS switches on GaAs substrate: Design, fabrication, and reliability
2012 A., Persano; Tazzoli, Augusto; P., Farinelli; Meneghesso, Gaudenzio; P., Siciliano; F., Quaranta
Reliability analysis of AlGaN/GaN HEMT on SopSiC composite substrate under long-term DC-life test
2009 Ronchi, Nicolo'; Zanon, Franco; Stocco, Antonio; Tazzoli, Augusto; Zanoni, Enrico; Meneghesso, Gaudenzio
Reliability issues of Gallium Nitride High Electron Mobility Transistors
2010 Meneghesso, Gaudenzio; Meneghini, Matteo; Tazzoli, Augusto; Ronchi, Nicolo'; Stocco, Antonio; A., Chini; Zanoni, Enrico
Reliability of GaN high-electron-mobility transistors: State of the art and perspectives
2008 Meneghesso, Gaudenzio; Verzellesi, G; Danesin, Francesca; Rampazzo, Fabiana; Zanon, Franco; Tazzoli, Augusto; Meneghini, Matteo; Zanoni, Enrico