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Risultati 41 - 50 di 671 (tempo di esecuzione: 0.335 secondi).
Titolo Data di pubblicazione Autori Rivista Serie Titolo libro
Analysis and design of SARS-CoV-2 disinfection chambers based on UVC LEDs 2022 Trivellin, NBuffolo, MBarbato, MDel Vecchio, CDughiero, FZanoni, EMeneghesso, GCrisanti, AMeneghini, M + - PROCEEDINGS OF SPIE, THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING Proceedings Volume 12022, Light-Emitting Devices, Materials, and Applications XXVI
Analysis and Modeling of VthShift in 4H-SiC MOSFETs at Room and Cryogenic-Temperature 2022 Masin F.De Santi C.Meneghesso G.Zanoni E.Meneghini M. + - IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM PROCEEDINGS Proceedgins of 2022 IEEE International Reliability Physics Symposium (IRPS)
Analysis of a High-Power-Factor Electronic Ballast for High Brightness Light Emitting Diodes 2005 SPIAZZI, GIORGIOBUSO, SIMONEMENEGHESSO, GAUDENZIO - - Proceedings of PESC 2005
Analysis of DC and rf degradation of AlGaN/GaN High Electron Mobility Transistors based on pulsed measurements and spectroscopic techniques 2010 ZANONI, ENRICOSTOCCO, ANTONIOMENEGHINI, MATTEORAMPAZZO, FABIANARONCHI, NICOLO'TAZZOLI, AUGUSTOMENEGHESSO, GAUDENZIO + - - 5th Space Agency - MOD Round Table Workshop on GaN Component Technologies
Analysis of defect-related optical degradation of VCSILs for photonic integrated circuits 2023 Zenari M.Buffolo M.Fornasier M.De Santi C.Meneghesso G.Zanoni E.Meneghini M. + - - Proceedings of SPIE Photonics West 2023 conference
Analysis of degradation mechanisms in UVC single QW LEDs through electrical, optical and spectral measurements 2022 F. PivaN. RoccatoM. BuffoloC. De SantiM. PilatiG. MeneghessoE. ZanoniM. Meneghini + - - Proceedings of the 2022 International Workshop on Nitride Semiconductors
Analysis of degradation processes of UV‐A light emitting diodes stressed at constant current 2016 MONTI, DESIREEMENEGHINI, MATTEODE SANTI, CARLOMENEGHESSO, GAUDENZIOZANONI, ENRICO - - Proc. of 40th WOCSDICE ‐ Workshop on Compound Semiconductor Devices and Integrated Circuits held in Europe
Analysis of dislocation-related and point-defects in III-As layers by extensive DLTS study 2022 Zenari, MBuffolo, MDe Santi, CMeneghesso, GZanoni, EMeneghini, M + - PROCEEDINGS OF SPIE, THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING Proceedings Volume 11990, Nanoscale and Quantum Materials: From Synthesis and Laser Processing to Applications 2022
Analysis of efficiency-droop mechanisms in GaN-based light-emitting diodes, related technological solutions and discriminating experiments 2011 MENEGHINI, MATTEOMENEGHESSO, GAUDENZIOZANONI, ENRICO + - - 9th International Conference on Nitride Semiconductors (ICNS-9)
Analysis of efficiency-droop mechanisms in single-quantum well InGaN/GaN light-emitting diodes 2011 MENEGHINI, MATTEOMENEGHESSO, GAUDENZIOZANONI, ENRICO + - - Proc. Of the 38th International Symposium on Compound Semiconductors – ISCS 2011
Risultati 41 - 50 di 671 (tempo di esecuzione: 0.335 secondi).
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  • 04 CONTRIBUTO IN ATTO DI CONVEGNO 671
  • 04 CONTRIBUTO IN ATTO DI CONVEGNO... 671
Autore
  • ZANONI, ENRICO 529
  • MENEGHINI, MATTEO 410
  • DE SANTI, CARLO 193
  • TRIVELLIN, NICOLA 89
  • BUFFOLO, MATTEO 81
  • RAMPAZZO, FABIANA 81
  • TAZZOLI, AUGUSTO 71
  • STOCCO, ANTONIO 50
  • CESTER, ANDREA 35
  • BARBATO, MARCO 31
Data di pubblicazione
  • 2020 - 2023 107
  • 2010 - 2019 337
  • 2000 - 2009 184
  • 1992 - 1999 43
Editore
  • Institute of Electrical and Elect... 35
  • SPIE 33
  • IEEE 22
  • SPIE-INT SOC OPTICAL ENGINEERING 18
  • IEEE-INST ELECTRICAL ELECTRONICS ... 7
  • IEEE Institute of Electrical and ... 5
  • IEEE-INST ELECTRICAL ELECTRONICS ... 5
  • IEEE / Institute of Electrical an... 4
  • Gaudenzio Meneghesso 3
  • IEEE Computer Society 2
Rivista
  • PROCEEDINGS OF SPIE, THE INTERNAT... 10
  • IEEE INTERNATIONAL RELIABILITY PH... 6
  • PROCEEDINGS OF THE EUROPEAN SOLID... 5
  • AIP CONFERENCE PROCEEDINGS 2
  • PROCEEDINGS OF THE INTERNATIONAL ... 1
Serie
  • PROCEEDINGS OF SPIE, THE INTERNAT... 32
  • IEEE INTERNATIONAL RELIABILITY PH... 20
  • TECHNICAL DIGEST - INTERNATIONAL ... 4
  • PROCEEDINGS OF THE ... INTERNATIO... 1
  • PROCEEDINGS OF THE INTERNATIONAL ... 1
Keyword
  • reliability 172
  • HEMT 156
  • degradation 152
  • Gallium Nitride 140
  • Charge Trapping 66
  • light emitting diodes 65
  • InGaN 49
  • Electrostatic discharge (ESD) 36
  • MEMS 32
  • Gallium Arsenide 31
Lingua
  • eng 649
  • ita 4
  • jpn 1
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  • no fulltext 670
  • open 1