Sfoglia per Autore
Addressing the electrical degradation of 845 nm micro-transfer printed VCSILs through TCAD simulations
2023 Zenari, M.; Buffolo, M.; De Santi, C.; Goyvaerts, J.; Grabowski, A.; Gustavsson, J.; Baets, R.; Larsson, A.; Roelkens, G.; Meneghesso, G.; Zanoni, E.; Meneghini, M.
Mechanisms of Step-Stress Degradation In Carbon-Doped 0.15 μm Algan/Gan Hemts for Power RF Applications
2023 Zagni, Nicolò; Gao, Veronica Zhan; Verzellesi, Giovanni; Chini, Alessandro; Pantellini, Alessio; Natali, Marco; Lucibello, Andrea; Latessa, Luca; Lanzieri, Claudio; Santi, Carlo De; Meneghini, Matteo; Meneghesso, Gaudenzio; Zanoni, Enrico
Threshold Voltage Instability in SiC MOSFETs: Analysis and Modeling
2023 Meneghini, M.; Marcuzzi, A.; Masin, F.; De Santi, C.; Avramenko, M.; Geenen, F.; Moens, P.; Meneghesso, G.; Zanoni, E.
Reliability investigation on 265 nm UV-C LEDs from a commercial point of view
2023 Piva, Francesco; Buffolo, Matteo; DE SANTI, Carlo; Meneghesso, Gaudenzio; Zanoni, Enrico; Meneghini, Matteo; Trivellin, Nicola
Degradation of GaN-based InGaN-GaN MQWs solar cells caused by Thermally-Activated Diffusion
2023 Nicoletto, M.; Caria, A.; De Santi, C.; Buffolo, M.; Huang, X.; Fu, H.; Chen, H.; Zhao, Y.; Meneghesso, G.; Zanoni, E.; Meneghini, M.
Scaling of E-mode power GaN-HEMTs for low voltage/low Ron applications: Implications on robustness
2023 Benato, Andrea; De Santi, Carlo; Borga, Matteo; Bakeroot, Benoit; Filipek, Izabela Kuzma; Posthuma, Niels; Decoutere, Stefaan; Meneghesso, Gaudenzio; Zanoni, Enrico; Meneghini, Matteo
A Review of SiC Commercial Devices for Automotive: Properties and Challenges
2023 Marcuzzi, Alberto; Favero, Davide; DE SANTI, Carlo; Meneghesso, Gaudenzio; Zanoni, Enrico; Meneghini, Matteo
Transconductance Overshoot, a New Trap-Related Effect in AlGaN/GaN HEMTs
2023 Gao, Z.; Rampazzo, F; De Santi, C; Fornasier, M; Meneghesso, G; Meneghini, M; Blanck, H; Grunenputt, J; Sommer, D; Chen, Dy; Wen, Kh; Chen, Jt; Zanoni, E
Thermally-activated failure mechanisms of 0.25 μm RF AlGaN/GaN HEMTs submitted to long-term life tests
2023 Gao, Z; Chiocchetta, F; Rampazzo, F; De Santi, C; Fornasier, M; Meneghesso, G; Meneghini, M; Zanoni, E
Lifetime Prediction of Current-and Temperature-Induced Degradation in Silicone-Encapsulated 365 nm High-Power Light-Emitting Diodes
2023 Herzog, A; Benkner, S; Zandi, B; Buffolo, M; Van Driel, Wd; Meneghini, M; Khanh, Tq
Experimental analysis of degradation of Multi-Quantum Well GaN-based solar cells under current stress
2023 Caria, A.; De Santi, C.; Nicoletto, M.; Buffolo, M.; Huang, X.; Fu, H.; Chen, H.; Zhao, Y.; Meneghesso, G.; Zanoni, E.; Meneghini, M.
Reliability of commercial UV-C LEDs for disinfection purposes
2022 Trivellin, N.; Piva, F.; Fiorimonte, D.; Buffolo, M.; De Santi, C.; Zanoni, E.; Meneghesso, G.; Meneghini, M.
Analysis and Modeling of VthShift in 4H-SiC MOSFETs at Room and Cryogenic-Temperature
2022 Masin, F.; De Santi, C.; Stockman, A.; Lettens, J.; Geenen, F.; Meneghesso, G.; Zanoni, E.; Moens, P.; Meneghini, M.
On the performance and reliability of state-of-the-art commercial UV-C LEDs for disinfection purposes
2022 Piva, F; Fiorimonte, D; Trivellin, N; De Santi, C; Buffolo, M; Meneghesso, G; Zanoni, E; Meneghini, M
Cryogenic Ultra-Fast Bias Temperature Instability Trap Profiling of SiC MOSFETs
2022 Geenen, F.; Masin, F.; Stockman, A.; De Santi, C.; Lettens, J.; Waldhoer, D.; Meneghini, M.; Grasser, T.; Moens, P.
Conduction processes, modeling and deep levels in nitrogen-implanted β-Gallium oxide Schottky diodes
2022 DE SANTI, Carlo; Fregolent, Manuel; Buffolo, Matteo; Higashiwaki, Masataka; Meneghesso, Gaudenzio; Zanoni, Enrico; Meneghini, Matteo
Analysis of dislocation-related and point-defects in III-As layers by extensive DLTS study
2022 Zenari, M; Buffolo, M; De Santi, C; Norman, J; Meneghesso, G; Bowers, Je; Zanoni, E; Meneghini, M
Quantum efficiency of InGaN-GaN multi-quantum well solar cells: Experimental characterization and modeling
2022 Caria, A.; Nicoletto, M.; De Santi, C.; Buffolo, M.; Huang, X.; Fu, H.; Chen, H.; Zhao, Y.; Meneghesso, G.; Zanoni, E.; Meneghini, M.
GaN-based solar cells degradation kinetics investigated at high temperature under high-intensity 405 nm optical stress
2022 Caria, A; De Santi, C; Nicoletto, M; Buffolo, M; Huang, Xq; Fu, Hq; Chen, H; Zhao, Yj; Meneghesso, G; Zanoni, E; Meneghini, M
Photon-induced degradation of InGaN-based LED in open-circuit conditions investigated by steady-state photocapacitance and photoluminescence
2022 Caria, A.; De Santi, C.; Buffolo, M.; Meneghesso, G.; Zanoni, E.; Meneghini, M.
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