Sfoglia per Autore  

Opzioni
Mostrati risultati da 1 a 20 di 1.223
Titolo Data di pubblicazione Autori Rivista Serie Titolo libro
Modeling of the electrical characteristics and degradation mechanisms of UV-C LEDs 2024 Roccato, NicolaPiva, FrancescoDe Santi, CarloBuffolo, MatteoMeneghesso, GaudenzioZanoni, EnricoMeneghini, Matteo + IEEE PHOTONICS JOURNAL - -
V-Pits and Trench-Like Defects in High Periodicity MQWs GaN-Based Solar Cells: Extensive Electro-Optical Analysis 2024 Nicoletto, MarcoCaria, AlessandroRampazzo, FabianaDe Santi, CarloBuffolo, MatteoGasparotto, AndreaMeneghesso, GaudenzioZanoni, EnricoMeneghini, Matteo + IEEE TRANSACTIONS ON ELECTRON DEVICES - -
Review and Outlook on GaN and SiC Power Devices: Industrial State-of-the-Art, Applications, and Perspectives 2024 Buffolo, M.Favero, D.Marcuzzi, A.Santi, Carlo DeMeneghesso, G.Zanoni, E.Meneghini, M. IEEE TRANSACTIONS ON ELECTRON DEVICES - -
Modeling the Electrical Degradation of Micro-Transfer Printed 845 nm VCSILs for Silicon Photonics 2024 Zenari, MicheleBuffolo, MatteoSanti, Carlo DeMeneghesso, GaudenzioZanoni, EnricoMeneghini, Matteo + IEEE TRANSACTIONS ON ELECTRON DEVICES - -
Origin and Recovery of Negative Vth Shift on 4H-SiC MOS Capacitors: an Analysis Based on Inverse Laplace Transform and Temperature-Dependent Measurements 2023 Alberto MarcuzziCarlo De SantiGaudenzio MeneghessoEnrico ZanoniMatteo Meneghini + - - Proceedings of ICSCRM 2023 (International Conference on Silicon Carbide and Related Materials)
Storia e Storie del DEI. Trentacinque anni del Dipartimento di Ingegneria dell’Informazione dell’Università di Padova 2023 Maristella AgostiGaudenzio MeneghessoEnrico Zanoni - - -
Experimental analysis of degradation of Multi-Quantum Well GaN-based solar cells under current stress 2023 Caria A.De Santi C.Nicoletto M.Buffolo M.Chen H.Meneghesso G.Zanoni E.Meneghini M. + - - Proceedings of SPIE Photonics West 2023 conference
Trade-off between gate leakage current and threshold voltage stability in power HEMTs during ON-state and OFF-state stress 2023 Favero, D.De Santi, C.Meneghesso, G.Zanoni, E.Meneghini, M. + MICROELECTRONICS RELIABILITY - -
A Review of SiC Commercial Devices for Automotive: Properties and Challenges 2023 Alberto MarcuzziDavide FaveroCarlo De SantiGaudenzio MeneghessoEnrico ZanoniMatteo Meneghini - - Proceedings of the 7th AEIT International Conference of Electrical and Electronic Technologies for Automotive (AEIT AUTOMOTIVE 2023)
GaN-Based Lateral and Vertical Devices 2023 Meneghini M.De Santi C.Zanoni E.Meneghesso G. + - - Springer Handbook of Semiconductor Devices
Degradation of AlGaN-based SQW UV-C LEDs investigated by capacitance deep level transient spectroscopy 2023 Piva F.Buffolo M.De Santi C.Pilati M.Roccato N.Meneghesso G.Zanoni E.Meneghini M. + - - Proceedings of SPIE Photonics West 2023 conference
Scaling of E-mode power GaN-HEMTs for low voltage/low Ron applications: Implications on robustness 2023 De Santi, CarloMeneghesso, GaudenzioZanoni, EnricoMeneghini, Matteo + MICROELECTRONICS RELIABILITY - -
Characterization and C-DLTS analysis of antimony selenide solar cells 2023 Jessica Jazmine Nicole BarrantesCarlo De SantiFrancesco PivaMatteo BuffoloAlessandro CariaNicola TrivellinGaudenzio MeneghessoEnrico ZanoniMatteo Meneghini + - - Proceedings of Prima conferenza nazionale della Rete Italiana Fotovoltaico per la ricerca e l'innovazione (rete IFV)
Semi-Transparent Perovskite Solar Cells: Performance and Perspectives 2023 Noah TormenaJessica Jazmine Nicole BarrantesAlessandro CariaMatteo BuffoloCarlo De SantiNicola TrivellinGaudenzio MeneghessoEnrico ZanoniAndrea CesterMatteo Meneghini + - - Proceedings of Prima conferenza nazionale della Rete Italiana Fotovoltaico per la ricerca e l'innovazione (rete IFV)
GaN-based InGaN/GaN MQWs solar cells for innovative applications: performance and modeling 2023 Marco NicolettoAlessandro CariaCarlo De SantiMatteo BuffoloGaudenzio MeneghessoEnrico ZanoniMatteo Meneghini + - - Proceedings of Prima conferenza nazionale della Rete Italiana Fotovoltaico per la ricerca e l'innovazione (rete IFV)
Thermally-activated failure mechanisms of 0.25 μm RF AlGaN/GaN HEMTs submitted to long-term life tests 2023 Gao, ZChiocchetta, FRampazzo, FDe Santi, CFornasier, MMeneghesso, GMeneghini, MZanoni, E - IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM PROCEEDINGS Proceedings of the 2023 IEEE International Reliability Physics Symposium (IRPS 2023)
Degradation of GaN-Based Multiple Quantum Wells Solar Cells Under Forward Bias: Investigation Based on Optical Measurements and Steady-State Photocapacitance 2023 Caria, ADe Santi, CBuffolo, MNicoletto, MMeneghesso, GZanoni, EMeneghini, M + IEEE TRANSACTIONS ON ELECTRON DEVICES - -
Analysis of CdSe as an alternative buffer layer for Sb2Se3 solar cells 2023 Gasparotto, AndreaMeneghini, MatteoMeneghesso, Gaudenzio + SOLAR ENERGY - -
Impact of high-temperature operating lifetime tests on the stability of 0.15 μm AlGaN/GaN HEMTs: a temperature-dependent analysis 2023 Pilati, M.Buffolo, M.Rampazzo, F.De Santi, C.Meneghesso, G.Zanoni, E.Meneghini, M. + MICROELECTRONICS RELIABILITY - -
Solid State Lighting for horticolture: impact of LED reliability on light spectrum and intensity 2023 Trivellin, NicolaBuffolo, MatteoCaria, AlessandroDe Santi, CarloFraccaroli, RiccardoMeneghesso, GaudenzioZanoni, EnricoMeneghini, Matteo + - - Proceedings of 2023 IEEE Sustainable Smart Lighting World Conference & Expo (LS18)
Mostrati risultati da 1 a 20 di 1.223
Legenda icone

  •  file ad accesso aperto
  •  file disponibili sulla rete interna
  •  file disponibili agli utenti autorizzati
  •  file disponibili solo agli amministratori
  •  file sotto embargo
  •  nessun file disponibile