RicercaInizia una nuova ricerca

NOTA: è possibile cercare una corrispondenza esatta usando i doppi apici, ad es: "evoluzione della specie". Qualora si cerchi un identificativo, è consigliabile cercarlo in due modi differenti: tra apici con caratteri speciali es: "978-94-6366-274" oppure senza caratteri speciali solo come sequenza numerica: es 978946366274.

cerca in
Risultati 21 - 30 di 448 (tempo di esecuzione: 0.112 secondi).
Titolo Data di pubblicazione Autori Rivista Serie Titolo libro
Analysis and design of extreme intensity irradiation devices for research applications 2020 Trivellin N.Pizzolato A.Meneghini M.Dughiero F.Forzan M.Zanoni E.Meneghesso G. - PROCEEDINGS OF SPIE, THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING Proceedings of SPIE - The International Society for Optical Engineering
Analysis and design of SARS-CoV-2 disinfection chambers based on UVC LEDs 2022 Trivellin, NBuffolo, MBarbato, MDel Vecchio, CDughiero, FZanoni, EMeneghesso, GCrisanti, AMeneghini, M + - PROCEEDINGS OF SPIE, THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING Proceedings Volume 12022, Light-Emitting Devices, Materials, and Applications XXVI
Analysis and Modeling of VthShift in 4H-SiC MOSFETs at Room and Cryogenic-Temperature 2022 Masin F.De Santi C.Meneghesso G.Zanoni E.Meneghini M. + - IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM PROCEEDINGS Proceedgins of 2022 IEEE International Reliability Physics Symposium (IRPS)
Analysis of DC and rf degradation of AlGaN/GaN High Electron Mobility Transistors based on pulsed measurements and spectroscopic techniques 2010 ZANONI, ENRICOSTOCCO, ANTONIOMENEGHINI, MATTEORAMPAZZO, FABIANARONCHI, NICOLO'TAZZOLI, AUGUSTOMENEGHESSO, GAUDENZIO + - - 5th Space Agency - MOD Round Table Workshop on GaN Component Technologies
Analysis of defect-related optical degradation of VCSILs for photonic integrated circuits 2023 Zenari M.Buffolo M.Fornasier M.De Santi C.Meneghesso G.Zanoni E.Meneghini M. + - - Proceedings of SPIE Photonics West 2023 conference
Analysis of degradation mechanisms in UVC single QW LEDs through electrical, optical and spectral measurements 2022 F. PivaN. RoccatoM. BuffoloC. De SantiM. PilatiG. MeneghessoE. ZanoniM. Meneghini + - - Proceedings of the 2022 International Workshop on Nitride Semiconductors
Analysis of degradation processes of UV‐A light emitting diodes stressed at constant current 2016 MONTI, DESIREEMENEGHINI, MATTEODE SANTI, CARLOMENEGHESSO, GAUDENZIOZANONI, ENRICO - - Proc. of 40th WOCSDICE ‐ Workshop on Compound Semiconductor Devices and Integrated Circuits held in Europe
Analysis of dislocation-related and point-defects in III-As layers by extensive DLTS study 2022 Zenari, MBuffolo, MDe Santi, CMeneghesso, GZanoni, EMeneghini, M + - PROCEEDINGS OF SPIE, THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING Proceedings Volume 11990, Nanoscale and Quantum Materials: From Synthesis and Laser Processing to Applications 2022
Analysis of efficiency-droop mechanisms in GaN-based light-emitting diodes, related technological solutions and discriminating experiments 2011 MENEGHINI, MATTEOMENEGHESSO, GAUDENZIOZANONI, ENRICO + - - 9th International Conference on Nitride Semiconductors (ICNS-9)
Analysis of efficiency-droop mechanisms in single-quantum well InGaN/GaN light-emitting diodes 2011 MENEGHINI, MATTEOMENEGHESSO, GAUDENZIOZANONI, ENRICO + - - Proc. Of the 38th International Symposium on Compound Semiconductors – ISCS 2011
Risultati 21 - 30 di 448 (tempo di esecuzione: 0.112 secondi).
↑ Back to top
Legenda icone

  •  file ad accesso aperto
  •  file disponibili sulla rete interna
  •  file disponibili agli utenti autorizzati
  •  file disponibili solo agli amministratori
  •  file sotto embargo
  •  nessun file disponibile

Aggiungere filtri:  
Aggiungi
Opzioni
Scopri
Tipologia
  • 04 CONTRIBUTO IN ATTO DI CONVEGNO 448
  • 04 CONTRIBUTO IN ATTO DI CONVEGNO... 428
  • 04 CONTRIBUTO IN ATTO DI CONVEGNO... 20
Autore
  • MENEGHESSO, GAUDENZIO 429
  • ZANONI, ENRICO 418
  • DE SANTI, CARLO 205
  • TRIVELLIN, NICOLA 94
  • BUFFOLO, MATTEO 84
  • RAMPAZZO, FABIANA 53
  • STOCCO, ANTONIO 41
  • CARIA, ALESSANDRO 32
  • ROSSETTO, ISABELLA 31
  • BISI, DAVIDE 30
Data di pubblicazione
  • 2020 - 2023 112
  • 2010 - 2019 286
  • 2004 - 2009 50
Editore
  • Institute of Electrical and Elect... 35
  • SPIE 35
  • SPIE-INT SOC OPTICAL ENGINEERING 18
  • IEEE 16
  • IEEE Institute of Electrical and ... 4
  • IEEE-INST ELECTRICAL ELECTRONICS ... 3
  • IEEE-INST ELECTRICAL ELECTRONICS ... 3
  • IEEE / Institute of Electrical an... 2
  • IEEE Computer Society 2
  • Optica publishing group 2
Rivista
  • PROCEEDINGS OF SPIE, THE INTERNAT... 10
  • IEEE INTERNATIONAL RELIABILITY PH... 5
  • PROCEEDINGS OF THE EUROPEAN SOLID... 4
  • AIP CONFERENCE PROCEEDINGS 2
  • IEEE MTT-S INTERNATIONAL MICROWAV... 1
  • PROCEEDINGS OF THE INTERNATIONAL ... 1
Serie
  • PROCEEDINGS OF SPIE, THE INTERNAT... 33
  • IEEE INTERNATIONAL RELIABILITY PH... 19
  • TECHNICAL DIGEST - INTERNATIONAL ... 4
  • PROCEEDINGS OF THE INTERNATIONAL ... 2
  • PROCEEDINGS OF THE ... INTERNATIO... 1
Keyword
  • degradation 93
  • reliability 90
  • Gallium Nitride 71
  • HEMT 58
  • light emitting diodes 53
  • InGaN 42
  • Electrical and Electronic Enginee... 20
  • Reliability 20
  • GaN 17
  • Electronic 14
Lingua
  • eng 439
  • ita 2
Accesso al fulltext
  • no fulltext 447
  • open 1