Sfoglia per Autore
Influence of V-Pits on the Turn-On Voltage of GaN-Based High Periodicity Multiple Quantum Well Solar Cells
2023 Nicoletto, M; Caria, A; Rampazzo, F; De Santi, C; Buffolo, M; Mura, G; Rossi, F; Huang, Xq; Fu, Hq; Chen, H; Zhao, Yj; Meneghesso, G; Zanoni, E; Meneghini, M
Degradation of AlGaN-based UV-C SQW LEDs analyzed by means of capacitance deep-level transient spectroscopy and numerical simulations
2023 Piva, F.; Pilati, M.; Buffolo, M.; Roccato, N.; Susilo, N.; Hauer Vidal, D.; Muhin, A.; Sulmoni, L.; Wernicke, T.; Kneissl, M.; De Santi, C.; Meneghesso, G.; Zanoni, E.; Meneghini, M.
Addressing the Optical Degradation of 1.3 μm Quantum Dot Lasers through Subthreshold Characterization
2023 Zenari, Michele; Buffolo, Matteo; De Santi, Carlo; Norman, Justin; Hughes, Eamonn T.; Bowers, John E.; Herrick, Robert; Meneghesso, Gaudenzio; Zanoni, Enrico; Meneghini, Matteo
Impact of Mg-doping on the performance and degradation of AlGaN-based UV-C LEDs
2023 Piva, F.; Grigoletto, M.; Brescancin, R.; De Santi, C.; Buffolo, M.; Ruschel, J.; Glaab, J.; Hauer Vidal, D.; Guttmann, M.; Rass, J.; Einfeldt, S.; Susilo, N.; Wernicke, T.; Kneissl, M.; Meneghesso, G.; Zanoni, E.; Meneghini, M.
High-Temperature PBTI in Trench-Gate Vertical GaN Power MOSFETs: Role of Border and Semiconductor Traps
2023 Favero, D; Cavaliere, A; De Santi, C; Borga, M; Goncalez, W; Geens, K; Bakeroot, B; Decoutere, S; Meneghesso, G; Zanoni, E; Meneghini, M
Strategies for Enhancing the Photovoltaic Conversion Efficiency in Sb2Se3-based Solar Cells
2023 Rampino, Stefano; Spaggiari, Giulia; Jakomin, Roberto; Gilioli, Edmondo; Mezzadri, Francesco; Meneghini, Matteo; Barrantes, JESSICA JAZMINE NICOLE; Mazzer, Massimo; DE SANTI, Carlo; Pattini, Francesco
Novel models for the analysis of the dynamic performance of wide bandgap devices
2023 DE SANTI, Carlo; Fregolent, Manuel; Modolo, Nicola; Buffolo, Matteo; Rampazzo, Fabiana; Meneghesso, Gaudenzio; Zanoni, Enrico; Meneghini, Matteo
Dynamic Behavior of Threshold Voltage and ID–VDS Kink in AlGaN/GaN HEMTs Due to Poole–Frenkel Effect
2023 Gao, Zhan; De Santi, Carlo; Rampazzo, Fabiana; Saro, Marco; Fornasier, Mirko; Meneghesso, Gaudenzio; Meneghini, Matteo; Chini, Alessandro; Verzellesi, Giovanni; Zanoni, Enrico
Understanding the Optical Degradation of 845 nm Micro-Transfer-Printed VCSILs for Photonic Integrated Circuits
2023 Zenari, M; Buffolo, M; Fornasier, M; De Santi, C; Goyvaerts, J; Grabowski, A; Gustavsson, J; Kumari, S; Stassren, A; Baets, R; Larsson, A; Roelkens, G; Meneghesso, G; Zanoni, E; Meneghini, M
Modeling of the Optical and Electrical Degradation of 845 nm VCSILs
2023 Buffolo, M.; Zenari, M.; Fornasier, M.; De Santi, C.; Goyvaerts, J.; Grabowski, A.; Gustavsson, J.; Kumari, S.; Stassen, A.; Morthier, Geert; Baets, R.; Larsson, A.; Roelkens, G.; Meneghesso, G.; Zanoni, E.; Meneghini, M.
Performance and Degradation of Commercial Ultraviolet-C Light-Emitting Diodes for Disinfection Purposes
2023 Trivellin, N; Piva, F; Fiorimonte, D; Buffolo, M; De Santi, C; Zanoni, E; Meneghesso, G; Meneghini, M
Overview of Wide/Ultrawide Bandgap Power Semiconductor Devices for Distributed Energy Resources
2023 Mazumder, Sk; Voss, Lf; Dowling, Km; Conway, A; Hall, D; Kaplar, Rj; Pickrell, Gw; Flicker, J; Binder, At; Chowdhury, S; Veliadis, V; Luo, F; Khalil, S; Aichinger, T; Bahl, Sr; Meneghini, M; Charles, Ab
Modeling the electrical degradation of AlGaN-based UV-C LEDs by combined deep-level optical spectroscopy and TCAD simulations
2023 Roccato, N.; Piva, F.; De Santi, C.; Buffolo, M.; Fregolent, M.; Pilati, M.; Susilo, N.; Vidal, D. H.; Muhin, A.; Sulmoni, L.; Wernicke, T.; Kneissl, M.; Meneghesso, G.; Zanoni, E.; Meneghini, M.
Trade-off between gate leakage current and threshold voltage stability in power HEMTs during ON-state and OFF-state stress
2023 Favero, D.; De Santi, C.; Stockman, A.; Nardo, A.; Vanmeerbeek, P.; Tack, M.; Meneghesso, G.; Zanoni, E.; Meneghini, M.
A novel in-situ approach to monitor the variations in the on-resistance of power transistors during switching operation
2023 Cavaliere, A.; De Santi, C.; Meneghesso, G.; Zanoni, E.; Meneghini, M.
Threshold voltage instability in SiO2-gate semi-vertical GaN trench MOSFETs grown on silicon substrate
2023 Fregolent, M.; Del Fiol, A.; De Santi, C.; Huber, C.; Meneghesso, G.; Zanoni, E.; Meneghini, M.
Gate leakage modeling in lateral β-Ga2O3 MOSFETs with Al2O3 gate dielectric
2023 Fregolent, Manuel; Brusaterra, Enrico; De Santi, Carlo; Tetzner, Kornelius; Würfl, Joachim; Meneghesso, Gaudenzio; Zanoni, Enrico; Meneghini, Matteo
Dynamical properties and performances of ß-Ga2O3 UVC photodetectors of extreme solar blindness
2023 Dame, L.; Conan, L.; De Santi, C.; Caria, A.; Buffolo, M.; Meneghini, M.; Maso, P.; Dias, C.; Ghorbel, H.; Gilbert, P.; Meftah, M.; Bove, P.; Sandana, V.; Rogers, D.; Teherani, F.
Analysis of defect-related optical degradation of VCSILs for photonic integrated circuits
2023 Zenari, M.; Buffolo, M.; Fornasier, M.; De Santi, C.; Goyvaerts, J.; Grabowsky, A.; Gustavsson, J.; Kumari, S.; Stassren, A.; Baets, R.; Larsson, A.; Roelkens, G.; Meneghesso, G.; Zanoni, E.; Meneghini, M.
InGaN/GaN Multiple Quantum Wells solar cells: a trade-off in p-GaN thickness, to optimize reliability and quantum efficiency
2023 Nicoletto, Marco; Caria, Alessandro; DE SANTI, Carlo; Buffolo, Matteo; Huang, Xuanqui; Fu, Houqiang; Chen, Hong; Zhao, Yuji; Meneghesso, Gaudenzio; Zanoni, Enrico; Meneghini, Matteo
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