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BARBATO, ALESSANDRO

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Pubblicazioni (Tutti)

Risultati 1 - 20 di 21 (tempo di esecuzione: 0.001 secondi).

	Titolo	Data di pubblicazione	Autori	Rivista	Serie	Titolo libro
1	Power GaN HEMT degradation: From time-dependent breakdown to hot-electron effects	2019	MENEGHINI, MATTEO ; BARBATO, ALESSANDRO ; BORGA, MATTEO ; DE SANTI, CARLO ; BARBATO, MARCO ; STOFFELS, STEVE ; Zhao, M.; Posthuma, N.; Decoutere, S.; Haeberlen, O.; Detzel, T.; MENEGHESSO, GAUDENZIO ; ZANONI, ENRICO		TECHNICAL DIGEST - INTERNATIONAL ELECTRON DEVICES MEETING	Technical Digest - International Electron Devices Meeting, IEDM
2	Degradation physics of GaN-based lateral and vertical devices	2019	MENEGHINI, MATTEO ; DE SANTI, CARLO ; BARBATO, ALESSANDRO ; BORGA, MATTEO ; CANATO, ELEONORA ; CHIOCCHETTA, FRANCESCA ; FABRIS, ELENA ; MASIN, FABRIZIO ; NARDO, ARIANNA ; RAMPAZZO, FABIANA ; RUZZARIN, MARIA ; TAJALLI, ALALEH ; BARBATO, MARCO ; MENEGHESSO, GAUDENZIO ; ZANONI, ENRICO		PROCEEDINGS OF SPIE, THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING	Proceedings of SPIE - The International Society for Optical Engineering
3	REGULUS: Iodine Fed Plasma Propulsion System for Small Satellites	2019	MANENTE, MARCO ; TREZZOLANI, FABIO ; MANTELLATO, RICCARDO ; SCALZI, DAVIDE ; Alessandro Schiavon; SOUHAIR, NABIL ; DUZZI, MATTEO ; BARATO, FRANCESCO ; CAPPELLINI, LORENZO ; BARBATO, ALESSANDRO ; Devis Paulon; SELMO, ANTONIO FRANCO ; BELLOMO, NICOLAS ; GLODER, ALESSIA ; Elena Toson; MINUTE, MARCO ; MAGAROTTO, MIRKO ; PAVARIN, DANIELE			Proceedings of the 36th International Electric Propulsion Conference
4	Gallium Nitride power devices: challenges and perspectives	2018	MENEGHINI, MATTEO ; BARBATO, ALESSANDRO ; BORGA, MATTEO ; CANATO, ELEONORA ; DE SANTI, CARLO ; FABRIS, ELENA ; RAMPAZZO, FABIANA ; RUZZARIN, MARIA ; TAJALLI, ALALEH ; MENEGHESSO, GAUDENZIO ; ZANONI, ENRICO			Proceedings of the 50th Annual Meeting of the Associazione Società Italiana di Elettronica (SIE 2018)
5	Reliability Issues in Lateral and Vertical GaN FETs for Power Electronics	2018	MENEGHESSO, GAUDENZIO ; MENEGHINI, MATTEO ; DE SANTI, CARLO ; BARBATO, ALESSANDRO ; BARBATO, MARCO ; BORGA, MATTEO ; CANATO, ELEONORA ; FABRIS, ELENA ; MASIN, FABRIZIO ; RUZZARIN, MARIA ; TAJALLI, ALALEH ; ZANONI, ENRICO			Proceedings of the 2018 International Workshop on Nitride Semiconductors (IWN 2018)
6	Recent Advancements in Power GaN Reliability	2018	DE SANTI, CARLO ; MENEGHINI, MATTEO ; BORGA, MATTEO ; RUZZARIN, MARIA ; CANATO, ELEONORA ; TAJALLI, ALALEH ; BARBATO, ALESSANDRO ; FABRIS, ELENA ; ZANONI, ENRICO ; MENEGHESSO, GAUDENZIO			Proceedings of the 2018 Materials Research Society Spring Meeting
7	On Wafer Application Testing for 600 V E-mode GaN HEMTs in Boost Regime	2018	BARBATO, ALESSANDRO ; BARBATO, MARCO ; MENEGHINI, MATTEO ; M. Silvestri; T. Detzel; O. Haeberlen; SPIAZZI, GIORGIO ; MENEGHESSO, GAUDENZIO ; ZANONI, ENRICO			Proceedings of the GaN Marathon 2.0
8	Study of the stability of GaN-HEMTs with p-type Gate under forward Gate Bias	2018	RUZZARIN, MARIA ; MENEGHINI, MATTEO ; BARBATO, ALESSANDRO ; PADOVAN, VALERIA ; O. Haeberlen; M. Silvestri; T. Detzel; MENEGHESSO, GAUDENZIO ; ZANONI, ENRICO			Proceedings of the GaN Marathon 2.0
9	Challenges towards highly reliable GaN power transistors	2018	MENEGHINI, MATTEO ; BARBATO, ALESSANDRO ; BORGA, MATTEO ; CANATO, ELEONORA ; DE SANTI, CARLO ; FABRIS, ELENA ; RAMPAZZO, FABIANA ; TAJALLI, ALALEH ; MENEGHESSO, GAUDENZIO ; ZANONI, ENRICO			Proceedings of the GaN Marathon 2.0
10	Evidence of mechanical degradation in microelectromechanical switches subjected to long-Term stresses	2017	BARBATO, MARCO ; Mulloni, V.; BARBATO, ALESSANDRO ; Silvestrini, Matteo ; CESTER, ANDREA ; MENEGHESSO, GAUDENZIO			IEEE International Reliability Physics Symposium Proceedings
11	Reliability and failure analysis in power GaN-HEMTs: An overview	2017	MENEGHINI, MATTEO ; ROSSETTO, ISABELLA ; DE SANTI, CARLO ; RAMPAZZO, FABIANA ; TAJALLI, ALALEH ; BARBATO, ALESSANDRO ; RUZZARIN, MARIA ; BORGA, MATTEO ; CANATO, ELEONORA ; ZANONI, ENRICO ; MENEGHESSO, GAUDENZIO	IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM PROCEEDINGS		IEEE International Reliability Physics Symposium Proceedings
12	Potential induced degradation of N-type bifacial silicon solar cells: An investigation based on electrical and optical measurements	2017	BARBATO, MARCO ; BARBATO, ALESSANDRO ; MENEGHINI, MATTEO ; Tavernaro, G.; Rossetto, M.; MENEGHESSO, GAUDENZIO	SOLAR ENERGY MATERIALS AND SOLAR CELLS
13	Secondary electroluminescence of GaN-on-Si RF HEMTs: Demonstration and physical origin	2017	MENEGHINI, MATTEO ; BARBATO, ALESSANDRO ; ROSSETTO, ISABELLA ; FAVARON, ANDREA ; Silvestri, Marco; Lavanga, Simone; Sun, Haifeng; Brech, Helmut; MENEGHESSO, GAUDENZIO ; ZANONI, ENRICO	IEEE TRANSACTIONS ON ELECTRON DEVICES
14	Role of deep levels and time-dependent breakdown effects in determining performances and reliability of power GaN devices	2017	ZANONI, ENRICO ; BARBATO, ALESSANDRO ; BISI, DAVIDE ; DE SANTI, CARLO ; ROSSETTO, ISABELLA ; RUZZARIN, MARIA ; TRIVELLIN, NICOLA ; CHINI, ALESSANDRO ; MENEGHESSO, GAUDENZIO ; MENEGHINI, MATTEO			Proceedings of the 9th International Symposium on Advanced Plasma Science and its Applications for Nitrides and Nanomaterials (ISPlasma2017)
15	Reliability physics of GaN HEMTs for power switching applications: role of the gate structure	2017	ZANONI, ENRICO ; BARBATO, ALESSANDRO ; BISI, DAVIDE ; DE SANTI, CARLO ; RAMPAZZO, FABIANA ; ROSSETTO, ISABELLA ; RUZZARIN, MARIA ; TRIVELLIN, NICOLA ; Alessandro Chini; Giovanni Verzellesi; MENEGHESSO, GAUDENZIO ; MENEGHINI, MATTEO			Proceedings of the 12th International Conference on Nitride Semiconductors (ICNS-12)
16	Potential induced degradation in high-efficiency bifacial solar cells	2016	BARBATO, MARCO ; MENEGHINI, MATTEO ; CESTER, ANDREA ; BARBATO, ALESSANDRO ; MENEGHESSO, GAUDENZIO ; Tavernaro, G.; Rossetto, M.			IEEE International Reliability Physics Symposium Proceedings
17	A novel high voltage and high speed measurement system for dynamic RON measurements in GaN‐based high mobility transistors (HEMTs)	2016	BARBATO, ALESSANDRO ; ROSSETTO, ISABELLA ; BARBATO, MARCO ; MENEGHINI, MATTEO ; ZANONI, ENRICO ; MENEGHESSO, GAUDENZIO			Proc. of 40th WOCSDICE ‐ Workshop on Compound Semiconductor Devices and Integrated Circuits held in Europe
18	Durability of Bifacial Solar Modules under Potential Induced Degradation: Role of the Encapsulation Materials	2016	BARBATO, MARCO ; MENEGHINI, MATTEO ; BARBATO, ALESSANDRO ; Tavernaro, Giacomo; Rossetto, Mark; MENEGHESSO, GAUDENZIO			Proc. of the PVSEC2016, 32th European Photovoltaic Solar Energy Conference and Exhibition Conference
19	Reverse bias degradation of metal wrap through silicon solar cells	2016	BARBATO, MARCO ; BARBATO, ALESSANDRO ; MENEGHINI, MATTEO ; CESTER, ANDREA ; Mura, G.; Tonini, D.; Voltan, A.; Cellere, G.; MENEGHESSO, GAUDENZIO	SOLAR ENERGY MATERIALS AND SOLAR CELLS
20	Stress-induced instabilities of shunt paths in high efficiency MWT solar cells	2015	BARBATO, MARCO ; MENEGHINI, MATTEO ; CESTER, ANDREA ; BARBATO, ALESSANDRO ; ZANONI, ENRICO ; MENEGHESSO, GAUDENZIO ; Mura, G.; Tonini, D.; Voltan, A.; Cellere, G.			Proceedings of International Reliability Physics Symposium

Dettaglio

Nome completo:

BARBATO, ALESSANDRO

struttura:

Dipartimento di Ingegneria dell'Informazione - DEI

settore SSD:

Settore ING-INF/01 - Elettronica