MENEGHINI, MATTEO
MENEGHINI, MATTEO
Dipartimento di Ingegneria dell'Informazione - DEI
"Hot-plugging" of LED modules: Electrical characterization and device degradation
2013 DAL LAGO, Matteo; Meneghini, Matteo; Trivellin, Nicola; G., Mura; M., Vanzi; Meneghesso, Gaudenzio; Zanoni, Enrico
'Hole Redistribution' Model Explaining the Thermally Activated RONStress/Recovery Transients in Carbon-Doped AlGaN/GaN Power MIS-HEMTs
2021 Zagni, N.; Chini, A.; Puglisi, F. M.; Meneghini, M.; Meneghesso, G.; Zanoni, E.; Pavan, P.; Verzellesi, G.
2DEG Retraction and Potential Distribution of GaN-on-Si HEMTs Investigated Through a Floating Gate Terminal
2018 Rossetto, I.; Meneghini, M.; De Santi, C.; Pandey, Sudip; Gajda, M.; Hurkx, G. A. M.; Croon, J.; Šonský, J.; Meneghesso, G.; Zanoni, E.
A combined electro-optical method for the determination of the recombination parameters in InGaN-based light-emitting diodes
2009 Meneghini, Matteo; Trivellin, Nicola; Meneghesso, Gaudenzio; Zanoni, Enrico; U., Zehnder; B., Hahn
A model for the thermal degradation of metal/(p-GaN) interface in GaN-based light emitting diodes
2008 Meneghini, Matteo; Rigutti, L; Trevisanello, LORENZO ROBERTO; Cavallini, A; Meneghesso, Gaudenzio; Zanoni, Enrico
A new approach to correlate transport processes and optical efficiency in GaN-based LEDs
2009 Pavesi, M; Rossi, F; Manfredi, M; Salviati, G; Meneghini, Matteo; Zanoni, Enrico
A new method for CdSexTe1-x band grading for high efficiency thin-absorber CdTe solar cells
2021 Artegiani, E.; Gasparotto, A.; Punathil, P.; Kumar, V.; Barbato, M.; Meneghini, M.; Meneghesso, G.; Piccinelli, F.; Romeo, A.
A novel on-wafer approach to test the stability of GaN-based devices in hard switching conditions: Study of hot-electron effects
2020 Modolo, N.; Meneghini, M.; Barbato, A.; Nardo, A.; De Santi, C.; Meneghesso, G.; Zanoni, E.; Sicre, S.; Prechtl, G.; Curatola, G.
A Novel Physics-Based Approach to Analyze and Model E-Mode p-GaN Power HEMTs
2020 Modolo, Nicola; Tang, Shun-Wei; Jiang, Hong-Jia; De Santi, Carlo; Meneghini, Matteo; Wu, Tian-Li
A physical model for the reverse leakage current in (In,Ga)N/GaN light-emitting diodes based on nanowires
2016 Musolino, M.; Van Treeck, D; Tahraoui, A.; Scarparo, L.; DE SANTI, Carlo; Meneghini, Matteo; Zanoni, Enrico; Geelhaar, L.; Riechert, H.
A Physics-Based Approach to Model Hot-Electron Trapping Kinetics in p-GaN HEMTs
2021 Modolo, N.; De Santi, C.; Minetto, A.; Sayadi, L.; Sicre, S.; Prechtl, G.; Meneghesso, G.; Zanoni, E.; Meneghini, M.
A review of the reliability of integrated ir laser diodes for silicon photonics
2021 Buffolo, M.; De Santi, C.; Norman, J.; Shang, C.; Bowers, J. E.; Meneghesso, G.; Zanoni, E.; Meneghini, M.
A Review on the Physical Mechanisms That Limit the Reliability of GaN-Based LEDs
2010 Meneghini, Matteo; Tazzoli, Augusto; Mura, G; Meneghesso, Gaudenzio; Zanoni, Enrico
A review on the reliability of GaN-based LEDs
2008 Meneghini, Matteo; Trevisanello, LORENZO ROBERTO; Meneghesso, Gaudenzio; Zanoni, Enrico
Accelerated life test of high brightness light emitting diodes
2008 Trevisanello, LORENZO ROBERTO; Meneghini, Matteo; Mura, G; Vanzi, M; Pavesi, M; Meneghesso, Gaudenzio; Zanoni, Enrico
Ageing of InGaN-based LEDs: Effects on internal quantum efficiency and role of defects
2015 LA GRASSA, Marco; Meneghini, Matteo; DE SANTI, Carlo; Mandurrino, Marco; Goano, Michele; Bertazzi, Francesco; Zeisel, Roland; Galler, Bastian; Meneghesso, Gaudenzio; Zanoni, Enrico
AlGaN/GaN-Based HEMTs Failure Physics and Reliability: Mechanisms Affecting Gate Edge and Schottky Junction
2013 Zanoni, Enrico; Meneghini, Matteo; Alessandro, Chini; Denis, Marcon; Meneghesso, Gaudenzio
An analysis of the compositional techniques in John Chowning's Stria
2007 Meneghini, Matteo
Analysis of Current Transport Layer Localized Resistivity Increase After High Stress on InGaN LEDs
2023 Trivellin, Nicola; Buffolo, Matteo; De Santi, Carlo; Zanoni, Enrico; Meneghesso, Gaudenzio; Meneghini, Matteo
Analysis of DC Current Accelerated Life Tests of GaN LEDs Using a Weibull-Based Statistical Model
2005 Levada, Simone; Meneghini, Matteo; Meneghesso, Gaudenzio; Zanoni, Enrico