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Mostrati risultati da 1 a 20 di 821
Titolo Data di pubblicazione Autori Rivista Serie Titolo libro
Modeling of the electrical characteristics and degradation mechanisms of UV-C LEDs 2024 Roccato, NicolaPiva, FrancescoDe Santi, CarloBuffolo, MatteoMeneghesso, GaudenzioZanoni, EnricoMeneghini, Matteo + IEEE PHOTONICS JOURNAL - -
Review and Outlook on GaN and SiC Power Devices: Industrial State-of-the-Art, Applications, and Perspectives 2024 Buffolo, M.Favero, D.Marcuzzi, A.Santi, Carlo DeMeneghesso, G.Zanoni, E.Meneghini, M. IEEE TRANSACTIONS ON ELECTRON DEVICES - -
Modeling the Electrical Degradation of Micro-Transfer Printed 845 nm VCSILs for Silicon Photonics 2024 Zenari, MicheleBuffolo, MatteoSanti, Carlo DeMeneghesso, GaudenzioZanoni, EnricoMeneghini, Matteo + IEEE TRANSACTIONS ON ELECTRON DEVICES - -
V-Pits and Trench-Like Defects in High Periodicity MQWs GaN-Based Solar Cells: Extensive Electro-Optical Analysis 2024 Nicoletto, MarcoCaria, AlessandroRampazzo, FabianaDe Santi, CarloBuffolo, MatteoGasparotto, AndreaMeneghesso, GaudenzioZanoni, EnricoMeneghini, Matteo + IEEE TRANSACTIONS ON ELECTRON DEVICES - -
Injection-limited efficiency of InGaN LEDs and impact on electro-optical performance and ageing: a case study 2023 Casu, ClaudiaBuffolo, MatteoCaria, AlessandroDe Santi, CarloZanoni, EnricoMeneghesso, GaudenzioMeneghini, Matteo - - Proceedings of SPIE Photonics West 2023 conference - Light-Emitting Devices, Materials, and Applications XXVII
Correlating Interface and Border Traps With Distinctive Features of C–V Curves in Vertical Al2O3/GaN MOS Capacitors 2023 Fregolent, ManuelMarcuzzi, AlbertoSanti, Carlo DeMeneghesso, GaudenzioZanoni, EnricoBrusaterra, EnricoMeneghini, Matteo + IEEE TRANSACTIONS ON ELECTRON DEVICES - -
III-N optoelectronic devices: understanding the physics of electro-optical degradation 2023 Meneghini, MatteoRoccato, NicolaPiva, FrancescoDe Santi, CarloBuffolo, MatteoMeneghesso, GaudenzioZanoni, Enrico + - - Proc. SPIE 12441, Light-Emitting Devices, Materials, and Applications XXVII
Solid State Lighting for horticolture: impact of LED reliability on light spectrum and intensity 2023 Trivellin, NicolaBuffolo, MatteoCaria, AlessandroDe Santi, CarloFraccaroli, RiccardoMeneghesso, GaudenzioZanoni, EnricoMeneghini, Matteo + - - Proceedings of 2023 IEEE Sustainable Smart Lighting World Conference & Expo (LS18)
On the CET-Map Ill-Posed Inversion Problem: Theory and Application to GaN HEMTs 2023 De Santi, CMeneghesso, GZanoni, EMeneghini, M + IEEE TRANSACTIONS ON ELECTRON DEVICES - -
Characterization and C-DLTS analysis of antimony selenide solar cells 2023 Jessica Jazmine Nicole BarrantesCarlo De SantiFrancesco PivaMatteo BuffoloAlessandro CariaNicola TrivellinGaudenzio MeneghessoEnrico ZanoniMatteo Meneghini + - - Proceedings of Prima conferenza nazionale della Rete Italiana Fotovoltaico per la ricerca e l'innovazione (rete IFV)
Semi-Transparent Perovskite Solar Cells: Performance and Perspectives 2023 Noah TormenaJessica Jazmine Nicole BarrantesAlessandro CariaMatteo BuffoloCarlo De SantiNicola TrivellinGaudenzio MeneghessoEnrico ZanoniAndrea CesterMatteo Meneghini + - - Proceedings of Prima conferenza nazionale della Rete Italiana Fotovoltaico per la ricerca e l'innovazione (rete IFV)
GaN-based InGaN/GaN MQWs solar cells for innovative applications: performance and modeling 2023 Marco NicolettoAlessandro CariaCarlo De SantiMatteo BuffoloGaudenzio MeneghessoEnrico ZanoniMatteo Meneghini + - - Proceedings of Prima conferenza nazionale della Rete Italiana Fotovoltaico per la ricerca e l'innovazione (rete IFV)
GaN-on-Si Power HEMTs for Automotive: Current Status and Perspectives 2023 D. FaveroA. MarcuzziC. De SantiG. MeneghessoE. ZanoniM. Meneghini - - Proceedings of the 7th AEIT International Conference of Electrical and Electronic Technologies for Automotive (AEIT AUTOMOTIVE 2023)
Improving the Reliability of InAs Quantum-Dot Laser Diodes for Silicon Photonics: the Role of Trapping Layers and Misfit-Dislocation Density 2023 Buffolo M.Zenari M.De Santi C.Meneghesso G.Zanoni E.Meneghini M. + - - Proceedings of SPIE Photonics West 2023 conference
Novel approach of combined planar and cross-sectional defect analysis of stressed normally-on HEMT devices with leaky Schottky gates 2023 Gao, ZhanRampazzo, F.Meneghini, M.Zanoni, E. + MICROELECTRONICS RELIABILITY - -
Analysis of CdSe as an alternative buffer layer for Sb2Se3 solar cells 2023 Gasparotto, AndreaMeneghini, MatteoMeneghesso, Gaudenzio + SOLAR ENERGY - -
Degradation of AlGaN-based SQW UV-C LEDs investigated by capacitance deep level transient spectroscopy 2023 Piva F.Buffolo M.De Santi C.Pilati M.Roccato N.Meneghesso G.Zanoni E.Meneghini M. + - - Proceedings of SPIE Photonics West 2023 conference
Microwave and Millimeter-Wave GaN HEMTs: Impact of Epitaxial Structure on Short-Channel Effects, Electron Trapping, and Reliability 2023 Zanoni, EnricoSanti, Carlo DeGao, ZhanBuffolo, MatteoFornasier, MirkoSaro, MarcoPieri, Francesco DeRampazzo, FabianaMeneghesso, GaudenzioMeneghini, Matteo + IEEE TRANSACTIONS ON ELECTRON DEVICES - -
Status of Performance and Reliability of 265 nm Commercial UV-C LEDs in 2023 2023 Piva, FrancescoBuffolo, MatteoSanti, Carlo DeMeneghesso, GaudenzioZanoni, EnricoMeneghini, MatteoTrivellin, Nicola IEEE TRANSACTIONS ON ELECTRON DEVICES - -
Early failure of high-power white LEDs for outdoor applications under extreme electrical stress: Role of silicone encapsulant 2023 Caria, A.Fraccaroli, R.De Santi, C.Buffolo, M.Trivellin, N.Zanoni, E.Meneghesso, G.Meneghini, M. + MICROELECTRONICS RELIABILITY - -
Mostrati risultati da 1 a 20 di 821
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