ZANONI, ENRICO

ZANONI, ENRICO  

Dipartimento di Ingegneria dell'Informazione - DEI  

Mostra records
Risultati 1 - 20 di 470 (tempo di esecuzione: 0.034 secondi).
Titolo Data di pubblicazione Autori Rivista Serie Titolo libro
2.1 A/mm current density AlGaN/GaN HEMT 2003 CHINI, ALESSANDROMENEGHESSO, GAUDENZIOZANONI, ENRICOBUTTARI, DARIO + ELECTRONICS LETTERS - -
The 2018 GaN power electronics roadmap 2018 AMANO, HIROSHIBORGA, MATTEOGEURTS, CHARLES - MICHEL LOUIS - MARIE GHISLAINDe Santi, CarloMeneghesso, GaudenzioMeneghini, MatteoTrivellin, NicolaZanoni, Enrico + JOURNAL OF PHYSICS D. APPLIED PHYSICS - -
2DEG Retraction and Potential Distribution of GaN-on-Si HEMTs Investigated Through a Floating Gate Terminal 2018 Rossetto, I.Meneghini, M.De Santi, C.PANDEY, SUDIPMeneghesso, G.Zanoni, E. + IEEE TRANSACTIONS ON ELECTRON DEVICES - -
A combined electro-optical method for the determination of the recombination parameters in InGaN-based light-emitting diodes 2009 MENEGHINI, MATTEOTRIVELLIN, NICOLAMENEGHESSO, GAUDENZIOZANONI, ENRICO + JOURNAL OF APPLIED PHYSICS - -
A combined Monte Carlo and experimental analysis of light emission phenomena in AlGaAs/GaAs HBTs 1998 NEVIANI, ANDREAZANONI, ENRICO + SEMICONDUCTOR SCIENCE AND TECHNOLOGY - -
A model for the thermal degradation of metal/(p-GaN) interface in GaN-based light emitting diodes 2008 MENEGHINI, MATTEOTREVISANELLO, LORENZO ROBERTOMENEGHESSO, GAUDENZIOZANONI, ENRICO + JOURNAL OF APPLIED PHYSICS - -
A new approach to correlate transport processes and optical efficiency in GaN-based LEDs 2009 MENEGHINI, MATTEOZANONI, ENRICO + JOURNAL OF PHYSICS D. APPLIED PHYSICS - -
A novel fast and versatile temperature measurement system for LDMOS transistors 2005 TAZZOLI, AUGUSTOMENEGHESSO, GAUDENZIOZANONI, ENRICO MICROELECTRONICS RELIABILITY - -
A Review on the Physical Mechanisms That Limit the Reliability of GaN-Based LEDs 2010 MENEGHINI, MATTEOTAZZOLI, AUGUSTOMENEGHESSO, GAUDENZIOZANONI, ENRICO + IEEE TRANSACTIONS ON ELECTRON DEVICES - -
A review on the reliability of GaN-based LEDs 2008 MENEGHINI, MATTEOTREVISANELLO, LORENZO ROBERTOMENEGHESSO, GAUDENZIOZANONI, ENRICO IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY - -
A short-term high-current-density reliability investigation of AlGaAs/GaAs heterojunction bipolar transistors 1998 ZANONI, ENRICO + IEEE ELECTRON DEVICE LETTERS - -
A simple method for the thermal resistance measurement of AlGaAs/GaAs heterojunction bipolar transistors 1998 ZANONI, ENRICO + IEEE TRANSACTIONS ON ELECTRON DEVICES - -
A study of ESD- induced defects in high-voltage nMOS and pMOS transistors 1992 ZANONI, ENRICO + MICROELECTRONICS JOURNAL - -
Accelerated life test of high brightness light emitting diodes 2008 TREVISANELLO, LORENZO ROBERTOMENEGHINI, MATTEOMENEGHESSO, GAUDENZIOZANONI, ENRICO + IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY - -
L'affidabilità dei dispositivi a semiconduttore 1983 ZANONI, ENRICO + FISICA E TECNOLOGIA - -
Ageing of InGaN-based LEDs: Effects on internal quantum efficiency and role of defects 2015 LA GRASSA, MARCOMENEGHINI, MATTEODE SANTI, CARLOMENEGHESSO, GAUDENZIOZANONI, ENRICO + MICROELECTRONICS RELIABILITY - -
AlGaN/GaN-Based HEMTs Failure Physics and Reliability: Mechanisms Affecting Gate Edge and Schottky Junction 2013 ZANONI, ENRICOMENEGHINI, MATTEOMENEGHESSO, GAUDENZIO + IEEE TRANSACTIONS ON ELECTRON DEVICES - -
An Investigation of the Electrical Degradation of GaN High-Electron-Mobility Transistors by Numerical Simulations of DC Characteristics and Scattering Parameters 2011 MENEGHESSO, GAUDENZIOZANONI, ENRICO + JOURNAL OF ELECTRONIC MATERIALS - -
An Sem Based System For A Complete Characterization of Latch-up In Cmos Integrated-circuits 1986 ZANONI, ENRICO + SCANNING - -
Analysis of d.c. and a.c. anomalous latch-up effects in commercial CMOS integrated circuits 1991 ZANONI, ENRICOSPIAZZI, GIORGIO + MICROELECTRONICS RELIABILITY - -