MENEGHESSO, GAUDENZIO

MENEGHESSO, GAUDENZIO  

Dipartimento di Ingegneria dell'Informazione - DEI  

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Risultati 1 - 20 di 459 (tempo di esecuzione: 0.062 secondi).
Titolo Data di pubblicazione Autori Rivista Serie Titolo libro
2.1 A/mm current density AlGaN/GaN HEMT 2003 CHINI, ALESSANDROMENEGHESSO, GAUDENZIOZANONI, ENRICOBUTTARI, DARIO + ELECTRONICS LETTERS - -
The 2018 GaN power electronics roadmap 2018 AMANO, HIROSHIBORGA, MATTEOGEURTS, CHARLES - MICHEL LOUIS - MARIE GHISLAINDe Santi, CarloMeneghesso, GaudenzioMeneghini, MatteoTrivellin, NicolaZanoni, Enrico + JOURNAL OF PHYSICS D. APPLIED PHYSICS - -
2DEG Retraction and Potential Distribution of GaN-on-Si HEMTs Investigated Through a Floating Gate Terminal 2018 Rossetto, I.Meneghini, M.De Santi, C.PANDEY, SUDIPMeneghesso, G.Zanoni, E. + IEEE TRANSACTIONS ON ELECTRON DEVICES - -
A combined electro-optical method for the determination of the recombination parameters in InGaN-based light-emitting diodes 2009 MENEGHINI, MATTEOTRIVELLIN, NICOLAMENEGHESSO, GAUDENZIOZANONI, ENRICO + JOURNAL OF APPLIED PHYSICS - -
A Combined Mechanical and Electrical Characterization Procedure for Investigating the Dynamic Behavior of RF-MEMS Switches 2014 BARBATO, MARCOGILIBERTO, VALENTINACESTER, ANDREAMENEGHESSO, GAUDENZIO IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY - -
A comprehensive study of MEMS behavior under EOS/ESD events: Breakdown characterization, dielectric charging, and realistic cures 2011 TAZZOLI, AUGUSTOBARBATO, MARCOMENEGHESSO, GAUDENZIO + JOURNAL OF ELECTROSTATICS - -
A model for the thermal degradation of metal/(p-GaN) interface in GaN-based light emitting diodes 2008 MENEGHINI, MATTEOTREVISANELLO, LORENZO ROBERTOMENEGHESSO, GAUDENZIOZANONI, ENRICO + JOURNAL OF APPLIED PHYSICS - -
A novel fast and versatile temperature measurement system for LDMOS transistors 2005 TAZZOLI, AUGUSTOMENEGHESSO, GAUDENZIOZANONI, ENRICO MICROELECTRONICS RELIABILITY - -
A Review on the Physical Mechanisms That Limit the Reliability of GaN-Based LEDs 2010 MENEGHINI, MATTEOTAZZOLI, AUGUSTOMENEGHESSO, GAUDENZIOZANONI, ENRICO + IEEE TRANSACTIONS ON ELECTRON DEVICES - -
A review on the reliability of GaN-based LEDs 2008 MENEGHINI, MATTEOTREVISANELLO, LORENZO ROBERTOMENEGHESSO, GAUDENZIOZANONI, ENRICO IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY - -
A Statistical Approach to Microdose Induced Degradation in FinFET Devices 2009 GRIFFONI, ALESSIOGERARDIN, SIMONEMENEGHESSO, GAUDENZIOPACCAGNELLA, ALESSANDRO + IEEE TRANSACTIONS ON NUCLEAR SCIENCE - -
A Study of Hot-Electron Degradation Effects in pseudomorphic HEMTs 1997 MENEGHESSO, GAUDENZIO + MICROELECTRONICS RELIABILITY - -
Accelerated life test of high brightness light emitting diodes 2008 TREVISANELLO, LORENZO ROBERTOMENEGHINI, MATTEOMENEGHESSO, GAUDENZIOZANONI, ENRICO + IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY - -
Acceleration of Microwelding on Ohmic RF-MEMS Switches 2011 TAZZOLI, AUGUSTOMENEGHESSO, GAUDENZIO JOURNAL OF MICROELECTROMECHANICAL SYSTEMS - -
Ageing of InGaN-based LEDs: Effects on internal quantum efficiency and role of defects 2015 LA GRASSA, MARCOMENEGHINI, MATTEODE SANTI, CARLOMENEGHESSO, GAUDENZIOZANONI, ENRICO + MICROELECTRONICS RELIABILITY - -
Al2O3 Surface Passivation Characterized on Hydrophobic and Hydrophilic c-Si by a Combination of QSSPC, CV, XPS and FTIR 2012 MENEGHESSO, GAUDENZIO + ENERGY PROCEDIA - -
AlGaN/GaN-Based HEMTs Failure Physics and Reliability: Mechanisms Affecting Gate Edge and Schottky Junction 2013 ZANONI, ENRICOMENEGHINI, MATTEOMENEGHESSO, GAUDENZIO + IEEE TRANSACTIONS ON ELECTRON DEVICES - -
An active heat-based restoring mechanism for improving the reliability of RF-MEMS switches 2011 TAZZOLI, AUGUSTOMENEGHESSO, GAUDENZIO + MICROELECTRONICS RELIABILITY - -
An Investigation of the Electrical Degradation of GaN High-Electron-Mobility Transistors by Numerical Simulations of DC Characteristics and Scattering Parameters 2011 MENEGHESSO, GAUDENZIOZANONI, ENRICO + JOURNAL OF ELECTRONIC MATERIALS - -
Analysis of DC Current Accelerated Life Tests of GaN LEDs Using a Weibull-Based Statistical Model 2005 LEVADA, SIMONEMENEGHINI, MATTEOMENEGHESSO, GAUDENZIOZANONI, ENRICO IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY - -